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Электронный компонент: LP61L1008

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LP61L1008 Series
128K X 8 BIT 3.3V HIGH SPEED CENTER POWER CMOS SRAM
(June, 2002, Version 2.0)
AMIC Technology, Inc.
Document Title
128K X 8 BIT 3.3V HIGH SPEED CENTER POWER CMOS SRAM
Revision History
Rev. No. History
Issue Date
Remark
2.0
Add Product Family and 32-pin sTSOP (Type I) package
June 11, 2002
LP61L1008 Series
128K X 8 BIT 3.3V HIGH SPEED CENTER POWER CMOS SRAM
(June, 2002, Version 2.0)
1
AMIC Technology, Inc.
Features
General Description
n
Single 3.3V
10% power supply
n
Access times: 12/15 ns (max.)
n
Current: Operating: 180mA (max.)
Standby: 5mA (max.)
n
Full static operation, no clock or refreshing required
n
All inputs and outputs are directly TTL compatible
n
Center Power/Ground Pin Configuration
n
Common I/O using three-state output
n
Output enable and two chip enable inputs for easy
application
n
Data retention voltage: 2.0V (min.)
n
Available in 32-pin SOJ 300 mil and 32-pin sTSOP
packages
The LP61L1008 is a high speed 1,048,576-bit static
random access memory organized as 131,072
words by 8 bits and operates on a single 3.3V power
supply.
Inputs and three-state outputs are TTL compatible and
allow for direct interfacing with common system bus
structures.
The chip enable input is provided for POWER-DOWN
and device enable and an output enable input is included
for easy interfacing.
Data retention is guaranteed at a power supply voltage
as low as 2.0V.
Product Family
Power Dissipation
Product
Family
Operating
Temperature
VCC
Range
Speed
Data Retention
(I
CCDR
, Typ.)
Standby
(I
SB1
, Typ.)
Operating
(I
CC2
, Typ.)
Package
Type
LP61L1008
0
C~70
C
3.0V~3.6V
12/15 ns
10
A
20
A
66mA
32L SOJ
32L sTSOP
1. Typical values are measured at VCC = 3.0V, T
A
= 25
C and not 100% tested.
2. Data retention current VCC = 2.0V.

Pin Configuration

n
n
SOJ
n
n
sTSOP
A0
A1
A2
A3
CE
I/O
1
I/O
2
VCC
GND
I/O
3
I/O
4
WE
A4
A5
A6
A8
A7
A9
A10
A11
A12
I/O
5
I/O
6
VCC
I/O
7
I/O
8
OE
A13
A14
A15
A16
GND
LP61L1008S
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
A15
VCC
A16
A14
LP61L1008X
1
9
32
24
A0
A1
2
3
4
5
6
7
8
10
11
12
13
14
15
16
A2
A3
VCC
VSS
I/O
3
A4
A5
A6
A7
31
30
29
28
27
26
25
23
22
21
20
19
18
17
A13
OE
I/O
7
I/O
6
VSS
A11
A10
A9
A8
I/O
1
CE
I/O
0
I/O
5
I/O
4
A12
~~
~~
I/O
2
WE
LP61L1008 Series
(June, 2001, Version 2.0)
2
AMIC Technology, Inc.
Block Diagram
DECODER
256 X 4096
MEMORY ARRAY
INPUT
DATA
CIRCUIT
COLUMN I/O
CONTROL
CIRCUIT
VCC
GND
A0
A14
A15
A16
I/O
1
I/O
8
CE
OE
WE
Pin Description
Pin No.
Symbol
Description
1 - 4, 13 - 21,
29- 32
A0 - A16
Address Inputs
12
WE
Write Enable
28
OE
Output Enable
5
CE
Chip Enable
6 7, 10 - 11,
22 23, 26 - 27
I/O
1
- I/O
8
Data Input/Outputs
8, 24
VCC
Power Supply
9, 25
GND
Ground
LP61L1008 Series
(June, 2001, Version 2.0)
3
AMIC Technology, Inc.
Recommended DC Operating Conditions
(T
A
= 0
C to + 70
C)
Symbol
Parameter
Min.
Typ.
Max.
Unit
VCC
Supply Voltage
3.0
3.3
3.6
V
GND
Ground
0
0
0
V
V
IH
Input High Voltage
2.2
-
VCC + 0.3
V
V
IL
Input Low Voltage
-0.3
0
+0.8
V
C
L
Output Load
-
-
30
pF
TTL
Output Load
-
-
1
-

Absolute Maximum Ratings*

VCC to GND .............................................. -0.5V to +4.6V
IN, IN/OUT Volt to GND .....................-0.5V to VCC +0.5V
Operating Temperature, Topr ...................... 0
C to +70
C
Storage Temperature, Tstg..................... -55
C to +125
C
Temperature Under Bias, Tbias................ -10
C to +85
C
Power Dissipation, Pt................................................1.0W
Soldering Temp. & Time .............................260
C, 10 sec
*Comments

Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to this device.
These are stress ratings only. Functional operation of
this device at these or any other conditions above
those indicated in the operational sections of this
specification is not implied or intended. Exposure to
the absolute maximum rating conditions for extended
periods may affect device reliability.
DC Electrical Characteristics
(T
A
= 0
C to + 70
C, VCC = 3.3V
10%, GND = 0V)
LP61L1008-12/15
Symbol
Parameter
Min.
Max.
Unit
Conditions
I
LI
Input Leakage Current
-
2
A
V
IN
= GND to VCC
I
LO
Output Leakage Current
-
2
A
CE = V
IH
or
OE = V
IH
or WE = V
IL
V
I/O
= GND to VCC
-12
-
180
I
CC1
(1)
Dynamic Operating
Current
-15
-
170
mA
CE = V
IL
I
I/O
= 0 mA
I
SB
-
20
mA
CE = V
IH
I
SB1
Standby Power
Supply Current
-
5
mA
CE
VCC - 0.2V,
V
IN
0.2V or V
IN
VCC - 0.2V
V
OL
Output Low Voltage
-
0.4
V
I
OL
= 8 mA
V
OH
Output High Voltage
2.4
-
V
I
OH
= -4 mA
Note: 1. I
CC1
is dependent on output loading, cycle rates, and Read / Write patterns.
LP61L1008 Series
(June, 2001, Version 2.0)
4
AMIC Technology, Inc.
Truth Table
Mode
CE
OE
WE
I/O Operation
Supply Current
Standby
H
X
X
High Z
I
SB
, I
SB1
Output Disable
L
H
H
High Z
I
CC1
Read
L
L
H
D
OUT
I
CC1
Write
L
X
L
D
IN
I
CC1
Note: X = H or L
Capacitance
(T
A
= 25
C, f = 1.0MHz)
Symbol
Parameter
Min.
Max.
Unit
Conditions
C
IN
*
Input Capacitance
8
pF
V
IN
= 0V
C
I/O
*
Input/Output Capacitance
10
pF
V
I/O
= 0V
* These parameters are sampled and not 100% tested.
AC Characteristics
(T
A
= 0
C to +70
C, VCC = 3.3V
10%, GND = 0V)
Symbol
Parameter
LP61L1008-12
LP61L1008-15
Unit
Min.
Max.
Min.
Max.
Read Cycle
t
RC
Read Cycle Time
12
-
15
-
ns
t
AA
Address Access Time
-
12
-
15
ns
t
ACE
Chip Enable Access Time
CE
-
12
-
15
ns
t
OE
Output Enable to Output Valid
-
7
-
9
ns
t
CLZ
Chip Enable to Output in Low Z
CE
3
-
5
-
ns
t
OLZ
Output Enable to Output in Low Z
2
-
2
-
ns
t
CHZ
Chip Disable to Output in High Z
CE
-
7
-
10
ns
t
OHZ
Output Disable to Output in High Z
2
7
2
9
ns
t
OH
Output Hold from Address Change
2
-
5
-
ns