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Электронный компонент: MAX1171

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_________________General Description
The MAX1171 analog-to-digital converter (ADC) is a
12-bit monolithic ADC capable of sample rates greater
than 20Msps. An on-board input buffer and track/hold
function ensure excellent dynamic performance without
the need for external components. A 5pF input capaci-
tance minimizes development problems.
Logic inputs and outputs are TTL compatible. An over-
range output signal is provided to indicate overflow
conditions. Output data format is straight binary. Power
dissipation is a very low 1.1W with power-supply volt-
ages of +5.0V and -5.2V. The MAX1171 also provides a
wide input voltage range of 2.0V.
The MAX1171 is available in a 32-lead ceramic side-
brazed package and a 44-lead surface-mount CERQUAD
package.
_________________________Applications
Radar Receivers
Professional Video
Instrumentation
Imaging
Digital Communications
Digital Spectrum Analyzers
_____________________________Features
o
Monolithic, 12-Bit, 20Msps Converter
o
On-Chip Track/Hold
o
2.0V Analog Input Range
o
66dB SNR at 1MHz Input
o
Low Power: 1.1W
o
5pF Input Capacitance
o
TTL-Compatible Outputs
MAX1171
12-Bit, 20Msps, TTL-Output ADC
________________________________________________________________
Maxim Integrated Products
1
N.C.
VFB
VSB
VRT1
VRT2
VIN
VRT3
VST
VFT
N.C.
V
CC
D2
D3
D4
D5
D6
D7
D8
D9
D10
D11
N.C.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
CERQUAD
MAX1171
N.C.
D12
DGND
DV
CC
N.C.
CLK
N.C.
V
EE
N.C.
AGND
N.C.
D1
D0
N.C.
DGND
DV
CC
V
EE
N.C.
AGND
N.C.
V
CC
N.C.
___________________Pin Configurations
4-BIT FLASH CONVERTER
ANALOG GAIN
COMPRESSION
PROCESSOR
TRACK/
HOLD
AMPLIFIERS
ASYNCHRONOUS
8-BIT SAR
ERROR
CORRECTION,
DECODING
AND
OUTPUT TLL
DRIVERS
4
8
12
V
IN
INPUT
BUFFER
DIGITAL
OUTPUT
________________Functional Diagram
For the latest literature: http://www.maxim-ic.com, or phone 1-800-998-8800
________________Ordering Information
19-1133; Rev 0; 10/96
PART
MAX1171CDJ
MAX1171CBH
0C to +70C
0C to +70C
TEMP. RANGE
PIN-PACKAGE
32 Ceramic SB
44 CERQUAD
T O P V I E W
Pin Configurations continued at end of data sheet.
EVALUATION KIT
AVAILABLE
MAX1171
12-Bit, 20Msps, TTL-Output ADC
2
_______________________________________________________________________________________
ABSOLUTE MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
(V
CC
= +5.0V, V
EE
= -5.2V, DV
CC
= +5.0V, V
IN
= 2.0V, V
SB
= -2.0V, V
ST
= +2.0V, f
CLK
= 20MHz, 50% clock duty cycle,
T
A
= T
MIN
to T
MAX
, unless otherwise noted.)
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
V
CC
.......................................................................................+6V
V
EE
.........................................................................................-6V
Analog Input ........................................................V
FB
V
IN
V
FT
VFB, VFT ................................................................. -3.0V, +3.0V
Reference Ladder Current ..................................................12mA
CLK IN ...................................................................................V
CC
Digital Outputs.......................................................0mA to -30mA
Operating Temperature Range...............................0C to +70C
Junction Temperature (T
j
) ................................................+175C
Storage Temperature Range .............................-65C to +150C
Lead Temperature (soldering, 10sec) .............................+300C
IV
IV
TEST
LEVEL
LSB
Differential Nonlinearity
LSB
Integral Nonlinearity
Bits
Resolution
UNITS
PARAMETER
0.8
2.0
12
MIN
TYP
MAX
I
I
I
VI
k
Input Resistance
A
Input Bias Current
No Missing Codes
V
Input Voltage Range
100
300
30
60
Guaranteed
2.0
V
VI
/C
Reference Ladder Tempco
Reference Ladder Resistance
V
V
0.8
V
V
500
800
LSB
Negative Full-Scale Error
LSB
Positive Full-Scale Error
pF
Input Capacitance
MHz
Input Bandwidth
5.0
5.0
5
120
VI
MHz
Maximum Conversion Rate
20
V
ps-RMS
Aperture Jitter Time
V
V
V
5
VI
ns
Aperture Delay Time
ns
Output Delay
ns
Overvoltage Recovery Time
Clock
Cycle
Pipeline Delay (Latency)
1
14
18
20
1
V
IN
= 0V, T
A
= +25C
T
A
= +25C
3dB small signal
T
A
= +25C
T
A
= +25C
250kHz sample rate
T
A
= +25C
full scale
CONDITIONS
DC ACCURACY
(T
A
= +25C)
ANALOG INPUT
TIMING CHARACTERISTICS
REFERENCE INPUT
MAX1171
12-Bit, 20Msps, TTL-Output ADC
_______________________________________________________________________________________
3
V
V
V
V
Logic "0" Voltage
V
Logic "1" Voltage
%
Differential Gain
V
V
0.8
2.4
4.0
0.7
TEST
LEVEL
IV
I
I
ns
Pulse Width Low (CLK)
A
Maximum Input Current Low
A
Maximum Input Current High
20
0
5
20
0
5
20
Degrees
Differential Phase
dBc
Spurious-Free Dynamic Range
UNITS
PARAMETER
f
IN
= 3.58MHz and 4.35MHz,
T
A
= +25C
T
A
= +25C
T
A
= +25C
0.2
74
10.2
MIN
TYP
MAX
f
IN
= 3.58MHz and 4.35MHz,
T
A
= +25C
f
IN
= 1MHz, T
A
= +25C
f
IN
= 500kHz
CONDITIONS
10.0
9.5
f
IN
= 1MHz
f
IN
= 3.58MHz
I
IV
I
IV
dB
f
IN
= 3.58MHz
Harmonic Distortion
59
61
57
59
T
A
= +25C
T
A
= T
MIN
to T
MAX
I
IV
f
IN
= 1MHz
63
65
f
IN
= 500kHz
59
61
T
A
= +25C
T
A
= T
MIN
to T
MAX
63
66
59
62
T
A
= +25C
T
A
= T
MIN
to T
MAX
I
IV
I
IV
dB
f
IN
= 3.58MHz
Signal-to-Noise and Distortion
57
59
54
56
T
A
= +25C
T
A
= T
MIN
to T
MAX
I
IV
f
IN
= 1MHz
60
62
f
IN
= 500kHz
55
57
T
A
= +25C
T
A
= T
MIN
to T
MAX
60
63
55
58
T
A
= +25C
T
A
= T
MIN
to T
MAX
I
IV
V
Logic "1" Voltage
ns
Pulse Width High (CLK)
2.4
20
300
T
A
= +25C
I
V
Logic "0" Voltage
0.6
T
A
= +25C
ELECTRICAL CHARACTERISTICS (continued)
(V
CC
= +5.0V, V
EE
= -5.2V, DV
CC
= +5.0V, V
IN
= 2.0V, V
SB
= -2.0V, V
ST
= +2.0V, f
CLK
= 20MHz, 50% clock duty cycle,
T
A
= T
MIN
to T
MAX
, unless otherwise noted.)
I
IV
I
IV
dB
f
IN
= 3.58MHz
Signal-to-Noise Ratio
(without Harmonics)
62
64
58
60
T
A
= +25C
T
A
= T
MIN
to T
MAX
I
IV
f
IN
= 1MHz
64
66
f
IN
= 500kHz
58
60
T
A
= +25C
T
A
= T
MIN
to T
MAX
64
67
58
61
T
A
= +25C
T
A
= T
MIN
to T
MAX
Bits
Effective Number of Bits
DIGITAL INPUTS
DIGITAL OUTPUTS
DYNAMIC PERFORMANCE
ELECTRICAL CHARACTERISTICS (continued)
(V
CC
= +5.0V, V
EE
= -5.2V, DV
CC
= +5.0V, V
IN
= 2.0V, V
SB
= -2.0V, V
ST
= +2.0V, f
CLK
= 20MHz, 50% clock duty cycle,
T
A
= T
MIN
to T
MAX
, unless otherwise noted.)
MAX1171
12-Bit, 20Msps, TTL-Output ADC
4
_______________________________________________________________________________________
Note 1:
Typical thermal impedances (unsoldered, in free air):
32 Ceramic SB:
j
A
= 50C/W
44 CERQUAD:
j
A
= 78C/W,
j
A
at 1m/s airflow = 58C/W,
j
C
= 3.3C/W
Use forced-air cooling or heatsinking to maintain T
j
150C.
TEST
LEVEL
IV
I
4.75
5.0
5.25
UNITS
PARAMETER
DV
CC
IV
4.75
5.0
5.25
V
CC
MIN
TYP
MAX
Voltages
-V
EE
IV
CONDITIONS
-4.95
-5.2
-5.45
V
Power Dissipation
VI
1.1
1.3
W
Power-Supply Rejection
5V 0.25V, -5.2V 0.25V
V
1.0
LSB
135
150
DI
CC,
T
A
= T
MIN
to T
MAX
IV
40
55
I
CC,
T
A
= +25C
Currents
-I
EE,
T
A
= +25C
I
45
70
mA
POWER-SUPPLY REQUIREMENTS
100% production tested at T
A
= +25C. Parameter is guaranteed
over specified temperature range.
VI
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality
Assurance inspection. Any blank section in the
data column indicates that the specification is
not tested at the specified condition.
Unless otherwise noted, all tests are pulsed;
therefore, T
j
= T
C
= T
A
.
Parameter is a typical value for information purposes only.
V
Parameter is guaranteed (but not tested) by design and charac-
terization data.
IV
QA sample tested only at the specified temperatures.
III
100% production tested at T
A
= +25C, and sample tested at the
specified temperatures.
II
100% production tested at the specified temperature.
I
TEST PROCEDURE
TEST LEVEL
TEST LEVEL CODES
50
-25
0
25
50
75
SNR, THD, SINAD vs. TEMPERATURE
60
55
MAX1170 TOC-06
TEMPERATURE (C)
SNR, THD, SINAD (dB)
70
75
65
SNR
THD
SINAD
20
0.1
1
10
SIGNAL-TO-NOISE AND DISTORTION
vs. INPUT FREQUENCY
40
30
MAX1170 TOC-04
INPUT FREQUENCY (MHz)
SINAD (dB)
60
50
80
70
MAX1171
12-Bit, 20Msps, TTL-Output ADC
_______________________________________________________________________________________
5
__________________________________________Typical Operating Characteristics
(f
S
= 20Msps, f
IN
= 1MHz, T
A
= +25C, unless otherwise noted.)
20
0.1
1
10
SIGNAL-TO-NOISE RATIO
vs. INPUT FREQUENCY
40
30
MAX1170 TOC-01
INPUT FREQUENCY (MHz)
SNR (dB)
60
50
80
70
20
0.1
1
10
TOTAL HARMONIC DISTORTION
vs. INPUT FREQUENCY
40
30
MAX1170 TOC-02
INPUT FREQUENCY (MHz)
THD (dB)
60
50
80
70
20
1
10
100
SNR, THD, SINAD vs. SAMPLE RATE
40
30
MAX1170 TOC-03
SAMPLE RATE (Msps)
SNR, THD, SINAD (dB)
60
50
80
70
SINAD
SNR, THD
-120
0
1
2
3
4
5
SPECTRAL RESPONSE
-60
-90
MAX1170 TOC-05
FREQUENCY (MHz)
AMPLITUDE (dB)
0
-30