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Электронный компонент: TMS470R1A256

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TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
High-Performance Static CMOS Technology
Standard CAN Controller (SCC)
TMS470R1x 16/32-Bit RISC Core
16-Mailbox Capacity
(ARM7TDMITM)
Fully Compliant With CAN Protocol,
24-MHz System Clock (48-MHz Pipeline
Version 2.0B
Mode)
Class II Serial Interface (C2SIb)
Independent 16/32-Bit Instruction Set
Two Selectable Data Rates
Open Architecture With Third-Party Support
Normal Mode 10.4 Kbps and 4X Mode 41.6
Built-In Debug Module
Kbps
Big-Endian Format Utilized
High-End Timer (HET)
Integrated Memory
16 Programmable I/O Channels:
256K-Byte Program Flash
14 High-Resolution Pins
One Bank With 14 Contiguous Sectors
2 Standard-Resolution Pins
Internal State Machine for Programming
High-Resolution Share Feature (XOR)
and Erase
High-End Timer RAM
12K-Byte Static RAM (SRAM)
64-Instruction Capacity
Operating Features
10-Bit Multi-Buffered ADC (MibADC)
Core Supply Voltage (VCC): 1.81 V2.05 V
16-Channel
I/O Supply Voltage (VCCIO): 3.0 V3.6 V
64-Word FIFO Buffer
Low-Power Modes: STANDBY and HALT
Single- or Continuous-Conversion Modes
Industrial Temperature Ranges
1.55
s Minimum Sample and Conversion
Time
470+ System Module
Calibration Mode and Self-Test Features
32-Bit Address Space Decoding
Eight External Interrupts
Bus Supervision for Memory and
Peripherals
Flexible Interrupt Handling
Analog Watchdog (AWD) Timer
11 Dedicated GIO Pins, 1 Input-Only GIO Pin,
and 38 Additional Peripheral I/Os (A256)
Real-Time Interrupt (RTI)
External Clock Prescale (ECP) Module
System Integrity and Failure Detection
Programmable Low-Frequency External
Zero-Pin Phase-Locked Loop (ZPLL)-Based
Clock (CLK)
Clock Module With Prescaler
Compatible ROM Device
Multiply-by-4 or -8 Internal ZPLL Option
On-Chip Scan-Base Emulation Logic, IEEE
ZPLL Bypass Mode
Standard 1149.1 (JTAG) Test-Access Port
(1)
Six Communication Interfaces:
100-Pin Plastic Low-Profile Quad Flatpack (PZ
Two Serial Peripheral Interfaces (SPIs)
Suffix)
255 Programmable Baud Rates
Two Serial Communications Interfaces
(SCIs)
(1)
The test-access port is compatible with the IEEE Standard
1149.1-1990, IEEE Standard Test-Access Port and Boundary
2
24
Selectable Baud Rates
Scan Architecture. Boundary scan is not supported on this
Asynchronous/Isosynchronous Modes
device.
ARM7TDMI is a trademark of Advanced RISC Machines Limited (ARM).
PRODUCTION DATA information is current as of publication date.
Copyright 2004, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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50
49
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31
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29
28
27
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75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
ADIN[11]
ADIN[14]
ADIN[10]
ADIN[13]
ADIN[9]
ADIN[12]
AD
REFHI
AD
REFLO
V
CCAD
V
SSAD
TMS
TMS2
V
SS
V
CC
HET[0]
V
SS
V
CC
FLTP2
FLTP1
V
CCP
HET[2]
HET[4]
HET[6]
HET[7]
AWD
HET[18]
HET[20]
HET[21]
SPI2SCS
SPI2ENA
SPI2SOMI
SPI2SIMO
SPI2CLK
V
CC
V
SS
C2SIbRX
C2SIbTX
C2SIbLPN
HET[24]
HET[31]
SCI2TX
SCI2RX
GIOA[3]/INT3
GIOA[2]/INT2
GIOA[1]/INT1/ECLK
GIOA[0]/INT0
(A)
TEST
TRST
SPI1ENA
SPI1SCS
SPI1SIMO
SPI1SOMI
SPI1CLK
V
S
S
OSCOUT
OSCIN
V
C
C
RST
V
S
S
I
O
V
C
C
I
O
GIOB[3]
GIOB[2]
GIOB[1]
GIOB[0]
HET[13]
HET[12]
HET[1
1]
HET[10]
PORRST
GIOA[7]/INT7
GIOA[6]/INT6
GIOA[5]/INT5
GIOA[4]/INT4
ADIN[0]
ADIN[1]
ADIN[2]
ADIN[3]
ADIN[4]
ADIN[15]
ADIN[5]
ADIN[6]
ADIN[7]
ADEVT
V
C
C
V
S
S
SCI1RX
SCI1TX
SCI1CLK
CANSTX
CANSRX
CLKOUT
V
C
C
I
O
V
S
S
I
O
HET[8]
TCK
TDO
TDI
PLLDIS
ADIN[8]
HET[19]
DESCRIPTION
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
TMS470R1A256 100-PIN PZ PACKAGE (TOP VIEW)
A.
GIOA[0]/INT0 (pin 28) is an input-only GIO pin.
The TMS470R1A256
(1)
devices are members of the Texas Instruments TMS470R1x family of general-purpose
16/32-bit reduced instruction set computer (RISC) microcontrollers. The A256 microcontroller offers high
performance utilizing the high-speed ARM7TDMI 16/32-bit RISC central processing unit (CPU), resulting in a
high instruction throughput while maintaining greater code efficiency. The ARM7TDMI 16/32-bit RISC CPU views
memory as a linear collection of bytes numbered upwards from 0. The TMS470R1A256 utilizes the big-endian
format where the most significant byte of a word is stored at the lowest numbered byte and the least significant
byte at the highest numbered byte.
High-end embedded control applications demand more performance from their controllers while maintaining low
costs. The A256 RISC core architecture offers solutions to these performance and cost demands while
maintaining low power consumption.
The A256 device contains the following:
ARM7TDMI 16/32-Bit RISC CPU
TMS470R1x system module (SYS) with 470+ enhancements
(1)
Throughout the remainder of this document, the TMS470R1A256 device name will be referred to as either the full device name,
TMS470R1A256, or as A256.
2
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TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
256K-byte Flash
12K-byte SRAM
Zero-pin phase-locked loop (ZPLL) clock module
Analog watchdog (AWD) timer
Real-time interrupt ( RTI) module
Two serial peripheral interface (SPI) modules
Two serial communications interface (SCI) modules
Standard CAN controller (SCC)
Class II serial interface (C2SIb)
10-bit multi-buffered analog-to-digital converter (MibADC), 16-input channels
High-end timer (HET) controlling 16 I/Os
External Clock Prescale (ECP)
Up to 49 I/O pins and 1 input-only pin
The functions performed by the 470+ system module (SYS) include:
Address decoding
Memory protection
Memory and peripherals bus supervision
Reset and abort exception management
Prioritization for all internal interrupt sources
Device clock control
Parallel signature analysis (PSA)
This data sheet includes device-specific information such as memory and peripheral select assignment,
interrupt priority, and a device memory map. For a more detailed functional description of the SYS module,
see the TMS470R1x System Module Reference Guide (literature number SPNU189).
The A256 memory includes general-purpose SRAM supporting single-cycle read/write accesses in byte,
half-word, and word modes.
The Flash memory on this device is a nonvolatile, electrically erasable and programmable memory implemented
with a 32-bit-wide data bus interface.The Flash operates with a system clock frequency of up to 24 MHz. In
pipeline mode, the Flash operates with a system clock frequency of up to 48 MHz. For more detailed information
on the Flash, see the Flash section of this data sheet and the TMS470R1x F05 Flash Reference Guide (literature
number SPNU213).
The A256 device has six communication interfaces: two SPIs, two SCIs, an SCC, and a C2SIb. The SPI provides
a convenient method of serial interaction for high-speed communications between similar shift-register type
devices. The SCI is a full-duplex, serial I/O interface intended for asynchronous communication between the
CPU and other peripherals using the standard Non-Return-to-Zero (NRZ) format. The SCC uses a serial,
multimaster communication protocol that efficiently supports distributed real-time control with robust communi-
cation rates of up to 1 megabit per second (Mbps). The SCC is ideal for applications operating in noisy and
harsh environments (e.g., industrial fields) that require reliable serial communication or multiplexed wiring. The
C2SIb allows the A256 to transmit and receive messages on a class II network following an SAE J1850
(2)
standard. For more detailed functional information on the SPI, SCI, and SCC peripherals, see the specific
reference guides (literature numbers SPNU195, SPNU196, and SPNU197, respectively). For more detailed
functional information on the C2SIb peripheral, see the TMS470R1x Class II Serial Interface B (C2SIb)
Reference Guide
(literature number SPNU214).
The HET is an advanced intelligent timer that provides sophisticated timing functions for real-time applications.
The timer is software-controlled, using a reduced instruction set, with a specialized timer micromachine and an
attached I/O port. The HET can be used for compare, capture, or general-purpose I/O. It is especially well suited
for applications requiring multiple sensor information and drive actuators with complex and accurate time pulses.
For more detailed functional information on the HET, see the TMS470R1x High-End Timer (HET) Reference
Guide
(literature number SPNU199).
(2)
SAE Standard J1850 Class B Data Communication Network Interface
3
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TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
The A256 device has a 10-bit-resolution sample-and-hold MibADC. The MibADC channels can be converted
individually or can be grouped by software for sequential conversion sequences. There are three separate
groupings, two of which are triggerable by an external event. Each sequence can be converted once when
triggered or configured for continuous conversion mode. For more detailed functional information on the MibADC,
see the TMS470R1x Multi-Buffered Analog-to-Digital Converter (MibADC) Reference Guide (literature number
SPNU206).
The zero-pin phase-locked loop (ZPLL) clock module contains a phase-locked loop, a clock-monitor circuit, a
clock-enable circuit, and a prescaler (with prescale values of 18). The function of the ZPLL is to multiply the
external frequency reference to a higher frequency for internal use. The ZPLL provides ACLK to the system
(SYS) module. The SYS module subsequently provides the system clock (SYSCLK), real-time interrupt clock
(RTICLK), CPU clock (MCLK), and peripheral interface clock (ICLK) to all other A256 device modules. For more
detailed functional information on the ZPLL, see the TMS470R1x Zero-Pin Phase Locked Loop (ZPLL) Clock
Module Reference Guide
(literature number SPNU212).
NOTE:
ACLK should not be confused with the MibADC internal clock, ADCLK. ACLK is the
continuous system clock from an external resonator/crystal reference.
The A256 device also has an external clock prescaler (ECP) module that when enabled, outputs a continuous
external clock (ECLK) on a specified GIO pin. The ECLK frequency is a user-programmable ratio of the
peripheral interface clock (ICLK) frequency. For more detailed functional information on the ECP, see the
TMS470R1x External Clock Prescaler (ECP) Reference Guide (literature number SPNU202).
4
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device characteristics
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
The TMS470R1A256 device is a derivative of the F05 system emulation device SE470R1VB8AD. Table 1
identifies all the characteristics of the TMS470R1A256 device except the SYSTEM and CPU, which are generic.
Table 1. Device Characteristics
DEVICE DESCRIP-
CHARACTERISTICS
COMMENTS
TION
MEMORY
For the number of memory selects on this device, see the "Memory Selection Assignment" table (Table 2).
Flash is pipeline-capable.
256K-Byte Flash
INTERNAL MEMORY
The A256 RAM is implemented in one 12K array selected by two memory-select
12K-Byte SRAM
signals (see the "Memory Selection Assignment" table, Table 2).
PERIPHERALS
For the device-specific interrupt priority configurations, see the "Interrupt Priority" table (Table 4). For the 1K peripheral address ranges and
their peripheral selects, see the "A256 Peripherals, System Module, and Flash Base Addresses" table (Table 3).
CLOCK
ZPLL
Zero-pin PLL has no external loop filter pins.
GENERAL-PURPOSE I/Os
11 I/O 1 Input only
Port A has 8 external pins and Port B has 4 external pins.
ECP
YES
C2SIb
1
SCI
1 (3-pin) 1 (2-pin)
SCI2 has no external clock pin, only transmit/receive pins (SCI2TX and SCI2RX)
CAN
1 SCC
Standard CAN controller
(HECC and/or SCC)
SPI (5-pin, 4-pin or 3-pin)
2 (5-pin)
The A256 devices have both the logic and registers for a full 32-I/O HET
implemented, even though not all 32 pins are available externally.
The high-resolution (HR) SHARE feature allows even HR pins to share the next
higher odd HR pin structures. This HR sharing is independent of whether or not the
HET with XOR Share
16 I/O
odd pin is available externally. If an odd pin is available externally and shared, then
the odd pin can only be used as a general-purpose I/O.
For more information on HR SHARE, see the TMS470R1x High-End Timer (HET)
Reference Guide
(literature number SPNU199).
HET RAM
64-Instruction Capacity
10-bit, 16-channel
Both the logic and registers for a full 16-channel MibADC are present. The
MibADC
64-word FIFO
MibADC is capable of being event-triggered from a user-selectable event source.
CORE VOLTAGE
1.812.05 V
I/O VOLTAGE
3.03.6 V
PINS
100
PACKAGE
PZ
5
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SPI1SCS
SPI2SCS
ZPLL
MibADC
with
64-Word
FIFO
PLLDIS
OSCOUT
ADIN[15:0]
ADEVT
AD
REFLO
AD
REFHI
HET with
XOR Share
(64-Word)
SPI2
SCI1
SCC
V
SSAD
HET [31:29, 24]
HET[22:0]
CANSRX
CANSTX
SCI1TX
SCI1CLK
V
CCAD
RAM
(12K Bytes)
TMS470R1x
CPU
CPU Address/Data Bus
TMS470R1x 470+ SYSTEM MODULE
OSCIN
External Pins
V
CCP
FLTP1
FLTP2
TCK
TMS
TDO
TDI
TRST
AWD
RST
TMS2
PORRST
CLKOUT
FLASH
(256K Bytes)
14 Sectors
C2SIb
C2SIbTX
C2SIbLPN
C2SIbRX
SCI1RX
Crystal
External Pins
SPI1
SPI2CLK
SPI2ENA
SPI2SIMO
SPI2SOMI
GIO
GIOA[0]/INT[0
]
(
A
)
GIOA[2:7]/
TEST
GIOA[1]/INT[1]/
ECP
ECLK
SCI2
SCI2TX
SCI2RX
SPI1CLK
SPI1ENA
SPI1SIMO
SPI1SOMI
INT[2:7]
Expansion Address/Data Bus
GIOB[3:0]
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
functional block diagram
A.
GIOA[0]/INT[0] is an input-only GIO pin.
6
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TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Table 2. Terminal Functions
TERMINAL
INTERNAL
TYPE
(1) (2)
PULLUP/
DESCRIPTION
PIN
NAME
PULLDOWN
(3)
NUMBER
HIGH-END TIMER (HET)
HET[0]
91
HET[1]
-
HET[2]
97
HET[3]
-
HET[4]
98
HET[5]
-
The A256 devices have both the logic and registers for a full 32-I/O
HET implemented, even though not all 32 pins are available
HET[6]
99
externally
HET[7]
100
Timer input capture or output compare. The HET[31:0] applicable
HET[8]
55
pins can be programmed as general-purpose input/output (GIO)
pins.
HET[9]
-
HET[10]
20
HET[21:18, 13:10, 8:6, 4, 2, 0] are high-resolution pins and HET[31,
24] are standard-resolution pins for A256.
HET[11]
19
The high-resolution (HR) SHARE feature allows even HR pins to
HET[12]
18
share the next higher odd HR pin structures. This HR sharing is
HET[13]
17
independent of whether or not the odd pin is available externally. If
3.3-V I/O
IPD
an odd pin is available externally and shared, then the odd pin can
HET[14]
-
only be used as a general-purpose I/O. For more information on HR
HET[15]
-
SHARE, see the TMS470R1x High-End Timer (HET) Reference
HET[16]
-
Guide (literature number SPNU199).
HET[17]
-
The HET[19] or HET[18] pins can also be used as a user-selectable
event source to event trigger the MibADC event group or group1 if
HET[18]
49
the associated register source bits are properly configured and
HET[19]
48
defined. For the internal device connections, see the MibADC
section of this data sheet. For more detailed functional information
HET[20]
47
on the MibADC, see the TMS470R1x Multi-Buffered
HET[21]
46
Analog-to-Digital Converter (MibADC) Reference Guide (literature
number SPNU206).
HET[22]
-
HET[24]
35
HET[28]
-
HET[29]
-
HET[30]
-
HET[31]
34
STANDARD CAN CONTROLLER (SCC)
CANSRX
59
3.3-V I/O
SCC receive pin or GIO pin
CANSTX
60
3.3-V I/O
IPU
SCC transmit pin or GIO pin
CLASS II SERIAL INTERFACE (C2SIb)
C2SIbLPN
36
3.3-V I/O
IPD
C2SIb module loopback enable pin or GIO pin
C2SIbRX
38
3.3-V I/O
C2SIb module receive data input pin or GIO pin
C2SIbTX
37
3.3-V I/O
IPD
C2SIb module transmit data output pin or GIO pin
(1)
I = input, O = output, PWR = power, GND = ground, REF = reference voltage, NC = no connect
(2)
All I/O pins, except RST, are configured as inputs while PORRST is low and immediately after PORRST goes high.
(3)
IPD = internal pulldown, IPU = internal pullup (all internal pullups and pulldowns are active on input pins, independent of the PORRST
state.)
7
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TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Table 2. Terminal Functions (continued)
TERMINAL
INTERNAL
TYPE
(1) (2)
PULLUP/
DESCRIPTION
PIN
NAME
PULLDOWN
(3)
NUMBER
GENERAL-PURPOSE I/O (GIO)
GIOA[0]/INT0
28
3.3-V I
GIOA[1]/INT1/
29
ECLK
GIOA[2]/INT2
30
GIOA[3]/INT3
31
General-purpose input/output pins.
GIOA[4]/INT4
25
GIOA[0]/INT[0] is an input-only pin. GIOA[7:0]/INT[7:0] are inter-
GIOA[5]/INT5
24
rupt-capable pins.
GIOA[6]/INT6
23
GIOA[1]/INT[1]/ECLK pin is multiplexed with the external clock-out
GIOA[7]/INT7
22
3.3-V I/O
IPD
function of the external clock prescale (ECP) module.
GIOB[0]
16
GIOB[1]
15
GIOB[2]
14
GIOB[3]
13
MULTI-BUFFERED ANALOG-TO-DIGITAL CONVERTER (MibADC)
MibADC event input. ADEVT can be programmed as a GIO pin.The
ADEVT pin can also be used as a user-selectable event source to
event trigger the MibADC event group or group1 if the associated
ADEVT
66
3.3-V I/O
register source bits are properly configured and defined. For the
internal device connections, see the MibADC section of this data
sheet.
ADIN[0]
75
ADIN[1]
74
ADIN[2]
73
ADIN[3]
72
ADIN[4]
71
ADIN[5]
69
IPD
ADIN[6]
68
ADIN[7]
67
3.3-V I
MibADC analog input pins
ADIN[8]
82
ADIN[9]
80
ADIN[10]
78
ADIN[11]
76
ADIN[12]
81
ADIN[13]
79
ADIN[14]
77
ADIN[15]
70
AD
REFHI
83
3.3-V REF I
MibADC module high-voltage reference input
AD
REFLO
84
GND REF I
MibADC module low-voltage reference input
V
CCAD
85
3.3-V PWR
MibADC analog supply voltage
V
SSAD
86
GND
MibADC analog ground reference.
8
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TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Table 2. Terminal Functions (continued)
TERMINAL
INTERNAL
TYPE
(1) (2)
PULLUP/
DESCRIPTION
PIN
NAME
PULLDOWN
(3)
NUMBER
SERIAL PERIPHERAL INTERFACE 1 (SPI1)
SPI1CLK
5
SPI1 clock. SPI1CLK can be programmed as a GIO pin.
SPI1ENA
1
SPI1 chip enable. SPI1ENA can be programmed as a GIO pin.
SPI1SCS
2
SPI1 slave chip select. SPI1SCS can be programmed as a GIO pin.
3.3-V I/O
IPD
SPI1 data stream. Slave in/master out. SPI1SIMO can be pro-
SPI1SIMO
3
grammed as a GIO pin.
SPI1 data stream. Slave out/master in. SPI1SOMI can be pro-
SPI1SOMI
4
grammed as a GIO pin.
SERIAL PERIPHERAL INTERFACE 2 (SPI2)
SPI2CLK
41
SPI2 clock. SPI2CLK can be programmed as a GIO pin.
SPI2ENA
44
SPI2 chip enable. SPI2ENA can be programmed as a GIO pin.
SPI2SCS
45
SPI2 slave chip select. SPI2SCS can be programmed as a GIO pin.
3.3-V I/O
IPD
SPI2 data stream. Slave in/master out. SPI2SIMO can be pro-
SPI2SIMO
42
grammed as a GIO pin.
SPI2 data stream. Slave out/master in. SPI2SOMI can be pro-
SPI2SOMI
43
grammed as a GIO pin.
ZERO-PIN PHASE-LOCKED LOOP (ZPLL)
OSCIN
8
1.8-V I
Crystal connection pin or external clock input
OSCOUT
7
1.8-V O
External crystal connection pin
Enable/disable the ZPLL. The ZPLL can be bypassed and the
oscillator becomes the system clock. If not in bypass mode, TI
PLLDIS
51
3.3-V I
IPD
recommends that PLLDIS be connected to ground or pulled down to
ground by an external resistor.
SERIAL COMMUNICATIONS INTERFACE 1 (SCI1)
SCI1CLK
61
3.3-V I/O
IPD
SCI1 clock. SCI1CLK can be programmed as a GIO pin.
SCI1RX
63
3.3-V I/O
IPU
SCI1 data receive. SCI1RX can be programmed as a GIO pin.
SCI1TX
62
3.3-V I/O
IPU
SCI1 data transmit. SCI1TX can be programmed as a GIO pin.
SERIAL COMMUNICATIONS INTERFACE 2 (SCI2)
SCI2RX
32
3.3-V I/O
IPU
SCI2 data receive. SCI2RX can be programmed as a GIO pin.
SCI2TX
33
3.3-V I/O
IPU
SCI2 data transmit. SCI2TX can be programmed as a GIO pin.
SYSTEM MODULE (SYS)
Bidirectional pin. CLKOUT can be programmed as a GIO pin or the
CLKOUT
58
3.3-V I/O
IPD
output of SYSCLK, ICLK, or MCLK.
Input master chip power-up reset. External V
CC
monitor circuitry
PORRST
21
3.3-V I
IPD
must assert a power-on reset.
Bidirectional reset. The internal circuitry can assert a reset, and an
external system reset can assert a device reset. On RST, the output
RST
10
3.3-V I/O
IPU
buffer is implemented as an open drain (drives low only). To ensure
an external reset is not arbitrarily generated, TI recommends that an
external pullup resistor be connected to RST.
WATCHDOG/REAL-TIME INTERRUPT (WD/RTI)
Analog watchdog reset. The AWD pin provides a system reset if the
WD KEY is not written in time by the system, providing an external
RC network circuit is connected. If the user is not using AWD, TI
recommends that AWD be connected to ground or pulled down to
ground by an external resistor.
AWD
50
3.3-V I/O
IPD
For more details on the external RC network circuit, see the
TMS470R1x System Module Reference Guide(literature number
SPNU189) and the application note Analog Watchdog Resistor,
Capacitor and Discharge Interval Selection Constraints
(literature
number SPNA005).
9
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TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Table 2. Terminal Functions (continued)
TERMINAL
INTERNAL
TYPE
(1) (2)
PULLUP/
DESCRIPTION
PIN
NAME
PULLDOWN
(3)
NUMBER
TEST/DEBUG (T/D)
TCK
54
3.3-V I
IPD
Test clock. TCK controls the test hardware (JTAG)
Test data in. TDI inputs serial data to the test instruction register,
TDI
52
3.3-V I
IPU
test data register, and programmable test address (JTAG).
Test data out. TDO outputs serial data from the test instruction
TDO
53
3.3-V O
IPD
register, test data register, identification register, and programmable
test address (JTAG).
Test enable. Reserved for internal use only. TI recommends that
TEST
27
3.3-V I
IPD
TEST be connected to ground or pulled down to ground by an
external resistor.
Serial input for controlling the state of the CPU test access port
TMS
87
3.3-V I
IPU
(TAP) controller (JTAG)
Serial input for controlling the second TAP. TI recommends that
TMS2
88
3.3-V I
IPU
TMS2 be connected to VCCIO or pulled up to VCCIO by an external
resistor.
Test hardware reset to TAP1 and TAP2. IEEE Standard 1149-1
TRST
26
3.3-V I
IPD
(JTAG) Boundary-Scan Logic. TI recommends that TRST be pulled
down to ground by an external resistor.
FLASH
Flash test pads 1 and 2. For proper operation, these pins must
FLTP1
95
not be connected (no connect [NC]).
NC
FLTP2
94
V
CCP
96
3.3-V PWR
Flash external pump voltage (3.3 V)
SUPPLY VOLTAGE CORE (1.8 V)
9
40
V
CC
65
1.8-V PWR
Core logic supply voltage
90
93
SUPPLY VOLTAGE DIGITAL I/O (3.3 V)
12
V
CCIO
3.3-V PWR
Digital I/O supply voltage
57
SUPPLY GROUND CORE
6
39
V
SS
64
GND
Core supply ground reference
89
92
SUPPLY GROUND DIGITAL I/O
11
V
SSIO
GND
Digital I/O supply ground reference
56
10
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A256 DEVICE-SPECIFIC INFORMATION
memory
0xFFE8_C000
0xFFE8_8000
0xFFFF_FFFF
System Module Control Registers
(512K Bytes)
Exception, Interrupt, and
Reset Vectors
Memory (4G Bytes)
Program
and
Data Area
Peripheral Control Registers
(512K Bytes)
Reserved
MPU Control Registers
Reserved
0xFFF8_0000
0xFFF7_FFFF
0xFFF0_0000
0xFFE8_BFFF
0xFFE8_7FFF
0xFFE8_4024
0xFFE8_4023
0xFFE8_4000
0xFFE0_0000
0x0000_001F
0x0000_0000
FIQ
IRQ
Reserved
Data Abort
Prefetch Abort
Software Interrupt
Undefined Instruction
Reset
0x0000_ 001F
0x0000_ 001C
0x0000_ 0018
0x0000_ 0014
0x0000_ 0010
0x0000_ 000C
0x0000_ 0008
0x0000_ 0004
0x0000_ 0000
Reserved
0xFFFF_FD00
0xFFF8_0000
HET
0xFFF7_FC00
0xFFF7_F800
0xFFF7_F400
0xFFF7_F000
0xFFF7_EC00
0xFFF7_E400
SPI1
SCI1
MibADC
GIO/ECP
Reserved
RAM
(12K Bytes)
FLASH
(256K Bytes)
14 Sectors
Flash Control Registers
Reserved
0xFFEF_FFFF
SCC RAM
SCC
0xFFF7_E000
0xFFF7_DC00
0xFFF7_D800
0xFFF7_D400
C2SIb
Reserved
0xFFF0_0000
SYSTEM
0xFFE8_3FFF
SCI2
0xFFF7_F500
Reserved
RESERVED
SPI2
0xFFF7_C800
0xFFF7_CC00
0xFFFF_FFFF
0x0000_0020
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Figure 1 shows the memory map of the A256 device.
A.
Memory addresses are configurable by the system (SYS) module within the range of 0x0000_0000 to 0xFFE0_0000.
B.
The CPU registers are not part of the memory map.
Figure 1. Memory Map
11
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memory selects
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Memory selects allow the user to address memory arrays (i.e., Flash, RAM, and HET RAM) at user-defined
addresses. Each memory select has its own set (low and high) of memory base address registers (MFBAHRx
and MFBALRx) that together define the array's starting (base) address, block size, and protection.
The base address of each memory select is configurable to any memory address boundary that is a multiple of
the decoded block size. For more information on how to control and configure these memory select registers, see
the bus structure and memory sections of the TMS470R1x System Module Reference Guide (literature number
SPNU189).
For the memory selection assignments and the memory selected, see Table 3.
Table 3. Memory Selection Assignment
MEMORY
MEMORY SELECTED
MEMORY
STATIC MEM
MPU
MEMORY BASE ADDRESS REGISTER
SELECT
(ALL INTERNAL)
SIZE
CTL REGISTER
0 (fine)
FLASH
NO
MFBAHR0 and MFBALR0
256K
1 (fine)
FLASH
NO
MFBAHR1 and MFBALR1
2 (fine)
RAM
YES
MFBAHR2 and MFBALR2
12K
(1)
3 (fine)
RAM
YES
MFBAHR3 and MFBALR3
4 (fine)
HET RAM
1K
MFBAHR4 and MFBALR4
SMCR1
(1)
The starting addresses for both RAM memory-select signals cannot be offset from each other by a multiple of the user-defined block
size in the memory-base address register.
RAM
The A256 device contains 12K bytes of internal static RAM configurable by the SYS module to be addressed
within the range of 0x0000_0000 to 0xFFE0_0000. This RAM is implemented in one 12K array selected by two
memory-select signals. This configuration imposes an additional constraint on the memory map for RAM; the
starting addresses for both RAM memory selects cannot be offset from each other by the multiples of the size of
the physical RAM (i.e., 12K for the A256 device). The RAM is addressed through memory selects 2 and 3.
The RAM can be protected by the memory protection unit (MPU) portion of the SYS module, allowing the user
finer blocks of memory protection than is allowed by the memory selects. The MPU is ideal for protecting an
operating system while allowing access to the current task. For more detailed information on the MPU portion of
the SYS module and memory protection, see the memory section of the TMS470R1x System Module Reference
Guide
(literature number SPNU189).
F05 Flash
The F05 Flash memory is a nonvolatile electrically erasable, and programmable memory implemented with a
32-bit-wide data bus interface. The F05 Flash has an external state machine for programming and erase
functions. See the Flash read and Flash program and erase sections of this document.
Flash protection keys
The A256 device provides Flash protection keys. These four 32-bit protection keys prevent pro-
gram/erase/compaction operations from occurring until after the four protection keys have been matched by the
CPU loading the correct user keys into the FMPKEY control register. The protection keys on the A256 are
located in the last 4 words of the first 8K sector. For more detailed information on the Flash protection keys and
the FMPKEY control register, see the protection keys portions of the TMS470R1x F05 Flash Reference Guide
(literature number SPNU213).
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TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Flash read
The A256 Flash memory is configurable by the SYS module to be addressed within the range of 0x0000_0000 to
0xFFE0_0000. The Flash is addressed through memory selects 0 and 1.
NOTE:
The Flash external pump voltage (V
CCP
) is required for all operations (program, erase,
and read).
Flash pipeline mode
When in pipeline mode, the Flash operates with a system clock frequency of up to 48 MHz (versus a system
clock in normal mode of up to 24 MHz). Flash in pipeline mode is capable of accessing 64-bit words and
provides two 32-bit pipelined words to the CPU. Also in pipeline mode, the Flash can be read with no wait states
when memory addresses are contiguous (after the initial 1-or 2-wait-state reads).
NOTE:
After a system reset, pipeline mode is disabled (ENPIPE bit [FMREGOPT.0] is a 0). In
other words, the A256 device powers up and comes out of reset in non-pipeline
mode. Furthermore, setting the Flash configuration mode bit (GLBCTRL.4) will
override pipeline mode.
Flash program and erase
The A256 device Flash has one 256K-byte bank that consists of fourteen sectors. These fourteen sectors are
sized as follows:
SECTOR NO.
SEGMENT
LOW ADDRESS
HIGH ADDRESS
0
8K Bytes
0x00000000
0x00001FFF
1
8K Bytes
0x00002000
0x00003FFF
2
8K Bytes
0x00004000
0x00005FFF
3
8K Bytes
0x00006000
0x00007FFF
4
32K Bytes
0x00008000
0x0000FFFF
5
32K Bytes
0x00010000
0x00017FFF
6
32K Bytes
0x00018000
0x0001FFFF
7
32K Bytes
0x00020000
0x00027FFF
8
32K Bytes
0x00028000
0x0002FFFF
9
32K Bytes
0x00030000
0x00037FFF
10
8K Bytes
0x00038000
0x00039FFF
11
8K Bytes
0x0003A000
0x0003BFFF
12
8K Bytes
0x0003C000
0x0003DFFF
13
8K Bytes
0x0003E000
0x0003FFFF
The minimum size for an erase operation is one sector. The maximum size for a program operation is one 16-bit
word.
NOTE:
The Flash external pump voltage (V
CCP
) is required for all operations (program, erase,
and read).
For more detailed information on Flash program and erase operations, see the TMS470R1x F05 Flash
Reference Guide
(literature number SPNU213).
13
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peripheral selects and base addresses
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
HET RAM
The A256 device contains HET RAM. The HET RAM has a 64-instruction capability. The HET RAM is
configurable by the SYS module to be addressed within the range of 0x0000_0000 to 0xFFE0_0000. The HET
RAM is addressed through memory select 4.
XOR share
The A256 HET peripheral contains the XOR-share feature. This feature allows two adjacent HET high-resolution
channels to be XORed together, making it possible to output smaller pulses than a standard HET. For more
detailed information on the HET XOR-share feature, see the TMS470R1x High-End Timer (HET) Reference
Guide
(literature number SPNU199).
The A256 device uses 10 of the 16 peripheral selects to decode the base addresses of the peripherals. These
peripheral selects are fixed and transparent to the user since they are part of the decoding scheme used by the
SYS module.
Control registers for the peripherals, SYS module, and Flash begin at the base addresses shown in Table 4.
Table 4. A256 Peripherals, System Module, and Flash Base Addresses
ADDRESS RANGE
CONNECTING MODULE
PERIPHERAL SELECTS
BASE ADDRESS
ENDING ADDRESS
SYSTEM
0xFFFF_FD00
0xFFFF_FFFF
N/A
RESERVED
0xFFF8_0000
0xFFFF_FCFF
N/A
HET
0xFFF7_FC00
0xFFF7_FFFF
PS[0]
SPI1
0xFFF7_F800
0xFFF7_FBFF
PS[1]
SCI2
0XFFF7_F500
0XFFF7_F7FF
PS[2]
SCI1
0xFFF7_F400
0xFFF7_F4FF
ADC
0xFFF7_F000
0xFFF7_F3FF
PS[3]
GIO/ECP
0xFFF7_EC00
0xFFF7_EFFF
PS[4]
RESERVED
0xFFF7_E400
0xFFF7_EBFF
PS[5] - PS[6]
SCC
0xFFF7_E000
0xFFF7_E3FF
PS[7]
SCC RAM
0xFFF7_DC00
0xFFF7_DFFF
PS[8]
RESERVED
0XFFF7_D800
0XFFF7_DBFF
PS[9]
SPI2
0XFFF7_D400
0XFFF7_D7FF
PS[10]
RESERVED
0xFFF7_CC00
0xFFF7_D3FF
PS[11] - PS[12]
C2SIb
0xFFF7_C800
0xFFF7_CBFF
PS[13]
RESERVED
0xFFF7_C000
0xFFF7_C7FF
PS[14] - PS[15]
RESERVED
0xFFF0_0000
0xFFF7_BFFF
N/A
FLASH CONTROL REGISTERS
0xFFE8_8000
0xFFE8_BFFF
N/A
MPU CONTROL REGISTERS
0xFFE8_4000
0xFFE8_4023
N/A
14
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interrupt priority
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
The central interrupt manager (CIM) portion of the SYS module manages the interrupt requests from the device
modules (i.e., SPI1 or SPI2, SCI1 or SCI2, and RTI, etc.).
Although the CIM can accept up to 32 interrupt request signals, the A256 device only uses 21 of those interrupt
request signals. The request channels are maskable so that individual channels can be selectively disabled. All
interrupt requests can be programmed in the CIM to be of either type:
Fast interrupt request (FIQ)
Normal interrupt request (IRQ)
The precedences of request channels decrease with ascending channel order in the CIM (0 [highest] and 31
[lowest] priority). For these channel priorities and the associated modules, see Table 5.
Table 5. Interrupt Priority
MODULES
INTERRUPT SOURCES
INTERRUPT LEVEL/CHANNEL
SPI1
SPI1 end-transfer/overrun
0
RTI
COMP2 interrupt
1
RTI
COMP1 interrupt
2
RTI
TAP interrupt
3
SPI2
SPI2 end-transfer/overrun
4
GIO
Interrupt A
5
RESERVED
6
HET
Interrupt 1
7
RESERVED
8
SCI1/SCI2
SCI1/SCI2 error interrupt
9
SCI1
SCI1 receive interrupt
10
C2SIb
C2SIb interrupt
11
RESERVED
12
RESERVED
13
SCC
Interrupt A
14
RESERVED
15
MibADC
End event conversion
16
SCI2
SCI2 receive interrupt
17
RESERVED
18
RESERVED
19
SCI1
SCI1 transmit interrupt
20
System
SW interrupt (SSI)
21
RESERVED
22
HET
Interrupt 2
23
RESERVED
24
SCC
Interrupt B
25
SCI2
SCI2 transmit interrupt
26
MibADC
End Group 1 conversion
27
RESERVED
28
GIO
Interrupt B
29
MibADC
End Group 2 conversion
30
RESERVED
31
15
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MibADC
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
The multi-buffered analog-to-digital converter (MibADC) accepts an analog signal and converts the signal to a
10-bit digital value.
The A256 MibADC module can function in two modes: compatibility mode, where its programmer's model is
compatible with the TMS470R1x ADC module and its digital results are stored in digital result registers; or in
buffered mode, where the digital result registers are replaced with three FIFO buffers, one for each conversion
group (event, group1 [G1], and group2 [G2]). In buffered mode, the MibADC buffers can be serviced by
interrupts.
MibADC event trigger enhancements
The MibADC includes two major enhancements over the event-triggering capability of the TMS470R1x ADC.
Both group1 and the event group can be configured for event-triggered operation, providing up to two
event-triggered groups.
The trigger source and polarity can be selected individually for both group 1 and the event group from the
three options identified in Table 6.
Table 6. MibADC Event Hookup Configuration
EVENT #
SOURCE SELECT BITS for G1 or EVENT
SIGNAL PIN NAME
(G1SRC[1:0] or EVSRC[1:0])
EVENT1
00
ADEVT
EVENT2
01
HET18
EVENT3
10
HET19
EVENT4
11
RESERVED
For group 1, these event-triggered selections are configured through the group 1 source select bits (G1SRC[1:0])
in the AD event source register (ADEVTSRC.[5:4]). For the event group, these event-triggered selections are
configured through the event group source select bits (EVSRC[1:0]) in the AD event source register
(ADEVTSRC.[1:0]).
For more detailed functional information on the MibADC, see the TMS470R1x Multi-Buffered Analog-to-Digital
Converter (MibADC) Reference Guide
(literature number SPNU206).
16
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documentation support
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Extensive documentation supports all of the TMS470 microcontroller family generation of devices. The types of
documentation available include: data sheets with design specifications; complete user's guides; and errata
sheets. Useful reference documentation includes:
Bulletin
TMS470 Microcontroller Family Product Bulletin (literature number SPNB086)
Data Sheets
TMS470R1A128 16/32Bit RISC Microcontroller (literature number SPNS098)
TMS470R1A64 16/32Bit RISC Microcontroller (literature number SPNS099)
TMS470R1A256 16/32Bit RISC Microcontroller (literature number SPNS100)
User's Guides
TMS470R1x System Module Reference Guide (literature number SPNU189)
TMS470R1x General Purpose Input/Output (GIO) Reference Guide (literature number SPNU192)
TMS470R1x Serial Peripheral Interface (SPI) Reference Guide SPNU195
TMS470R1x Serial Communication Interface (SCI) Reference Guide (literature number SPNU196)
TMS470R1x Controller Area Network (CAN) Reference Guide (literature number SPNU197)
TMS470R1x High End Timer (HET) Reference Guide (literature number SPNU199)
TMS470R1x External Clock Prescale (ECP) Reference Guide (literature number SPNU202)
TMS470R1x MultiBuffered Analog to Digital (MibADC) Reference Guide (literature number SPNU206)
TMS470R1x ZeroPin Phase Locked Loop (ZPLL) Clock Module Reference Guide (literature number
SPNU212)
TMS470R1x F05 Flash Reference Guide (literature number SPNU213)
TMS470R1x Class II Serial Interface B (C2SIb) Reference Guide (literature number SPNU214)
TMS470R1x Class II Serial Interface A (C2SIa) Reference Guide (literature number SPNU218)
TMS470 Peripherals Overview Reference Guide (literature number SPNU248)
Errata Sheet:
TMS470R1A256 TMS470 Microcontrollers Silicon Errata (literature number SPNZ133)
17
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device numbering conventions
PREFIX
470
FAMILY
DEVICE TYPE A
PZ
= 100-pin Low-Profile Quad Flatpack (LQFP)
TMS
470 = TMS470 RISC - Embedded
Microcontroller Family
A
PACKAGE TYPE
R1
ARCHITECTURE
R1 = ARM7TDM1 CPU
TMS = Fully Qualified Device
256 = 256K-Bytes Flash Memory
256
REVISION CHANGE
Blank = Original
Blank = No options
OPTIONS
FLASH MEMORY
With 256K-Bytes Flash memory:
1.8V Core, 3.3V I/O
Flash Program Memory
Temperature Range: -40
to +85
Celsius
ZPLL Clock
12K-Byte Static RAM
1K-Byte HET RAM (64 Instructions)
Analog Watchdog (AWD)
Real-Time Interrupt (RTI)
10-bit, 16-input MibADC
Two SPI Modules
Two SCI Modules
C2SIb
CAN [SCC]
HET, 16 Channels
ECP
PZ
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Figure 2 illustrates the numbering and symbol nomenclature for the TMS470R1x family.
Figure 2. TMS470R1x Family Nomenclature
18
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device identification code register
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
The device identification code register identifies the silicon version, the technology family (TF), a ROM or Flash
device, and an assigned device-specific part number (see Figure 3). The A256 device identification code register
value is 0x0857.
31
16
Reserved
15
12
11
10
9
3
2
1
0
VERSION
TF
R/F
PART NUMBER
1
1
1
R-K
R-K
R-K
R-K
R-1
R-1
R-1
LEGEND: R = Read only; -K = value constant after RESET; -n = value after RESET
Figure 3. TMS470 Device ID Bit Allocation Register
TMS470 Device ID Bit Allocation Register Description
BIT
NAME
Value
DESCRIPTION
31-16
Reserved
Reads are undefined and writes have no effect.
15-12
VERSION
Silicon version (revision) bits
These bits identify what version of silicon the device is. Initial device version numbers start at 0000.
11
TF
Technology Family (TF)
This bit distinguishes the technology family core power supply.
0
3.3 V for F10/C10 devices
1
1.8 V for F05/C05 devices
10
R/F
ROM/Flash
This bit distinguishes between ROM and Flash devices:
0
Flash device
1
ROM device
9-3
PART NUM-
Device-specific part number
BER
These bits identify the assigned device-specific part number.
The assigned device-specific part number for the A256 device is 0001010.
2-0
1
Mandatory High
Bits 2, 1, and 0 are tied high by default.
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Device electrical specifications and timing parameters
absolute maximum ratings over operating free-air temperature range
(1)
device recommended operating conditions
(1)
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Supply voltage ranges:
V
CC
, V
CCF
(2)
-0.3 V to 2.5
Supply voltage ranges:
V
CCIO
, V
CCAD
, V
CCP
(Flash pump)
(2)
-0.3 V to 4.1V
Input voltage range:
All input pins
-0.3 V to 4.1
Input clamp current:
I
IK
(V
I
< 0 or V
I
> V
CCIO
)
20 mA
All pins except ADIN[0:15], PORRST,
TRST, TEST and TCK
I
IK
(V
I
< 0 or V
I
> V
CCAD
)
10 mA
ADIN[0:11]
Operating free-air temperature ranges, T
A
:
-40
C to 85
C
Operating junction temperature range, T
J
-40
C to 150
C
Storage temperature range, T
stg
-65
C to 150
C
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
All voltage values are with respect to their associated grounds.
MIN
NOM
MAX
UNIT
V
CC
Digital logic and Flash supply voltage (Core)
1.81
2.05
V
V
CCIO
Digital logic supply voltage (I/O)
3
3.3
3.6
V
V
CCAD
ADC supply voltage
3
3.3
3.6
V
V
CCP
Flash pump supply voltage
3
3.3
3.6
V
V
SS
Digital logic supply ground
0
V
V
SSAD
ADC supply ground
-0.1
0.1
V
T
A
Operating free-air temperature
-40
85
C
T
J
Operating junction temperature
-40
150
C
(1)
All voltages are with respect to VSS, except VCCAD, which is with respect to VSSAD.
20
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electrical characteristics over recommended operating free-air temperature range
(1)
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
V
hys
Input hysteresis
0.15
V
All inputs
(2)
except OSCIN
-0.3
0.8
Low-level input
V
IL
V
voltage
OSCIN only
-0.3
0.35 V
CC
All inputs except OSCIN
2
V
CCIO
+ 0. 3
High-level input
V
IH
V
voltage
OSCIN only
0.65 V
CC
V
CC
+ 0. 3
Input threshold
V
th
AWD only
1.35
1.8
V
voltage
Drain to source
RDS
ON
on
AWD only
(3)
VOL = 0.35V @ I
OL
= 8mA
45
resistance
I
OL
= I
OL
MAX
0.2 V
CCIO
V
OL
Low-level output voltage
(4)
V
I
OL
= 50
A
0.2
I
OH
= I
OH
MIN
0.8 V
CCIO
V
OH
High-level output voltage
(4)
V
I
OH
= 50
A
V
CCIO
-0.2
V
I
< V
SSIO
-0. 3 or
I
IC
Input clamp current (I/O pins)
(5)
-2
2
mA
V
I
> V
CCIO
+ 0. 3
I
IL
Pulldown
V
I
= V
SS
-1
1
I
IH
Pulldown
V
I
= V
CCIO
5
40
Input current
I
I
I
IL
Pullup
V
I
= V
SS
-40
-5
A
(I/O pins)
I
IH
Pullup
V
I
= V
CCIO
-1
1
All other pins
No pullup or pulldown
-1
1
CLKOUT, AWD, TDO
V
OL
= V
OL
MAX
8
RST, SPI1CLK, SPI1SIMO,
Low-level output
I
OL
SPI1SOMI, SPI2CLK,
V
OL
= V
OL
MAX
4
mA
current
SPI2SIMO, SPI2SOMI
All other output pins
(6)
V
OL
= V
OL
MAX
2
CLKOUT, TDO
V
OH
= V
OH
MIN
-8
High-level out-
SPI1CLK, SPI1SIMO,
I
OH
put
SPI1SOMI, SPI2CLK,
V
OH
= V
OH
MIN
-4
mA
current
SPI2SIMO, SPI2SOMI
All other output pins
(6)
V
OH
= V
OH
MIN
-2
SYSCLK = 48 MHz, ICLK =
24 MHz,
75
mA
V
CC
= 2.05 V
V
CC
digital supply current (operating mode)
SYSCLK = 24 MHz, ICLK =
12 MHz,
50
mA
I
CC
V
CC
= 2.05 V
OSCIN = 6 MHz, V
CC
=
V
CC
digital supply current (standby mode)
(7)
3.0
mA
2.05 V
All frequencies, V
CC
= 2.05
V
CC
digital supply current (halt mode)
(7)
1.0
mA
V
(1)
Source currents (out of the device) are negative while sink currents (into the device) are positive.
(2)
This does not apply to the PORRST pin. For PORRST exceptions, see the RST and PORRST timings section.
(3)
These values help to determine the external RC network circuit. For more details, see the TMS470R1x System Module Reference Guide
(literature number SPNU189).
(4)
V
OL
and V
OH
are linear with respect to the amount of load current (I
OL
/I
OH
) applied.
(5)
Parameter does not apply to input-only or output-only pins.
(6)
The 2 mA buffers on this device are called zero-dominant buffers. If two of these buffers are shorted together and one is outputting a
low level and the other is outputting a high level, the resulting value will always be low.
(7)
For Flash pumps/banks in sleep mode.
21
www.ti.com
PARAMETER MEASUREMENT INFORMATION
Tester Pin
Electronics
V
LOAD
I
OL
C
L
I
OH
Output
Under
Test
50
Where: I
OL
= I
OL
MAX for the respective pin
(A)
I
OH
= I
OH
MIN for the respective pin
(A)
V
LOAD
= 1.5 V
C
L
= 150-pF typical load-circuit capacitance
(B)
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
electrical characteristics over recommended operating free-air temperature range (continued)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
No DC load, V
CCIO
= 3.6
V
CCIO
digital supply current (operating mode)
10
mA
V
(8)
No DC load, V
CCIO
= 3.6
I
CCIO
V
CCIO
digital supply current (standby mode)
300
A
V
(8)
No DC load, V
CCIO
= 3.6
V
CCIO
digital supply current (halt mode)
300
A
V
(8)
All frequencies, V
CCAD
=
V
CCAD
supply current (operating mode)
15
mA
3.6 V
All frequencies, V
CCAD
=
I
CCAD
V
CCAD
supply current (standby mode)
20
A
3.6 V
All frequencies, V
CCAD
=
V
CCAD
supply current (halt mode)
20
A
3.6 V
V
CCP
= 3.6 V read oper-
45
mA
ation
V
CCP
= 3.6 V program and
70
mA
erase
I
CCP
V
CCP
pump supply current
V
CCP
= 3.6 V standby mode
20
A
operation
(7)
V
CCP
= 3.6 V halt mode
20
A
operation
(7)
C
I
Input capacitance
2
pF
C
O
Output capacitance
3
pF
(8)
I/O pins configured as inputs or outputs with no load. All pulldown inputs
0.2 V. All pullup inputs
V
CCIO
- 0.2 V.
A.
For these values, see the "electrical characteristics over recommended operating free-air temperature range" table.
B.
All timing parameters measured using an external load capacitance of 150 pF unless otherwise noted.
Figure 4. Test Load Circuit
22
www.ti.com
timing parameter symbology
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Timing parameter symbols have been created in accordance with JEDEC Standard 100. To shorten the symbols,
some of the pin names and other related terminology have been abbreviated as follows:
CM
Compaction, CMPCT
RD
Read
CO
CLKOUT
RST
Reset, RST
ER
Erase
RX
SCInRX
ICLK
Interface clock
S
Slave mode
M
Master mode
SCC
SCInCLK
OSC, OSCI
OSCIN
SIMO
SPInSIMO
OSCO
OSCOUT
SOMI
SPInSOMI
P
Program, PROG
SPC
SPInCLK
R
Ready
SYS
System clock
R0
Read margin 0, RDMRGN0
TX
SCInTX
R1
Read margin 1, RDMRGN1
Lowercase subscripts and their meanings are:
a
access time
r
rise time
c
cycle time (period)
su
setup time
d
delay time
t
transition time
f
fall time
v
valid time
h
hold time
w
pulse duration (width)
The following additional letters are used with these meanings:
H
High
X
Unknown, changing, or don't care level
L
Low
Z
High impedance
V
Valid
23
www.ti.com
external reference resonator/crystal oscillator clock option
External
Clock Signal
(toggling 0 1.8 V)
OSCOUT
OSCIN
C2
(A)
C1
(A)
Crystal
OSCOUT
OSCIN
(a)
(b)
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
The oscillator is enabled by connecting the appropriate fundamental 420 MHz resonator/crystal and load
capacitors across the external OSCIN and OSCOUT pins as shown in Figure 5a. The oscillator is a single-stage
inverter held in bias by an integrated bias resistor. This resistor is disabled during leakage test measurement and
HALT mode. TI strongly encourages each customer to submit samples of the device to the res-
onator/crystal vendors for validation.
The vendors are equipped to determine what load capacitors will best
tune their resonator/crystal to the microcontroller device for optimum start-up and operation over tempera-
ture/voltage extremes.
An external oscillator source can be used by connecting a 1.8V clock signal to the OSCIN pin and leaving the
OSCOUT pin unconnected (open) as shown in Figure 5b.
A.
The values of C1 and C2 should be provided by the resonator/crystal vendor.
Figure 5. Crystal/Clock Connection
24
www.ti.com
ZPLL and clock specifications
timing requirements for ZPLL circuits enabled or disabled
switching characteristics over recommended operating conditions for clocks
(1) (2)
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
MIN
MAX
UNIT
f
(OSC)
Input clock frequency
4
20
MHz
t
c(OSC)
Cycle time, OSCIN
50
ns
t
w(OSCIL)
Pulse duration, OSCIN low
15
ns
t
w(OSCIH)
Pulse duration, OSCIN high
15
ns
f
(OSCRST)
OSC FAIL frequency
(1)
53
kHz
(1)
Causes a device reset (specifically a clock reset) by setting the RST OSC FAIL (GLBCTRL.15) and the OSC FAIL flag (GLBSTAT.1)
bits equal to 1. For more detailed information on these bits and device resets, see the TMS470R1x System Module Reference Guide
(literature number SPNU189).
PARAMETER
TEST CONDITION
(3)
MIN
MAX
UNIT
Pipeline mode enabled
48
f
(SYS)
System clock frequency
(4)
MHz
Pipeline mode disabled
24
f
(CONFIG)
System clock frequency - Flash config mode
24
MHz
Pipeline mode enabled
25
f
(ICLK)
Interface clock frequency
MHz
Pipeline mode disabled
24
Pipeline mode enabled
25
f
(ECLK)
External clock output frequency for ECP Module
MHz
Pipeline mode disabled
24
Pipeline mode enabled
20.8
t
c(SYS)
Cycle time, system clock
ns
Pipeline mode disabled
41.6
t
c(CONFIG)
Cycle time, system clock - Flash config mode
41.6
ns
Pipeline mode enabled
40
t
c(ICLK)
Cycle time, interface clock
ns
Pipeline mode disabled
41.6
Pipeline mode enabled
40
t
c(ECLK)
Cycle time, ECP module external clock output
ns
Pipeline mode disabled
41.6
(1)
f
(SYS)
= M
f
(OSC)
/ R, where M = {4 or 8}, R = {1,2,3,4,5,6,7,8} when PLLDIS = 0. R is the system-clock divider determined by the
CLKDIVPRE [2:0] bits in the global control register (GLBCTRL.[2:0]) and M is the PLL multiplier determined by the MULT4 bit, also in
the GLBCTRL register (GLBCTRL.3).
f
(SYS)
= f
(OSC)
/ R, where R = {1,2,3,4,5,6,7,8} when PLLDIS = 1.
f
(ICLK)
= f
(SYS)
/ X, where X = {1,2,3,4,5,6,7,8,9,10,11,12,13,14,15,16}. X is the interface clock divider ratio determined by the PCR0.[4:1]
bits in the SYS module.
(2)
f
(ECLK)
= f
(ICLK)
/ N, where N = {1 to 256}. N is the ECP prescale value defined by the ECPCTRL.[7:0] register bits in the ECP module
(3)
Pipeline mode enabled or disabled is determined by the ENPIPE bit (FMREGOPT.0).
(4)
Flash Vread must be set to 5V to achieve maximum system clock frequency.
25
www.ti.com
switching characteristics over recommended operating conditions for external clocks
(1) (2) (3)
CLKOUT
1
2
ECLK
3
4
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
(see Figure 6 and Figure 7)
NO.
PARAMETER
TEST CONDITION
MIN
MAX
UNIT
SYSCLK or MCLK
(4)
0.5t
c(SYS)
t
f
1
t
w(COL)
Pulse duration, CLKOUT low
ICLK, X is even or 1
(5)
0.5t
c(ICLK)
t
f
ns
ICLK, X is odd and not 1
(5)
0.5t
c(ICLK)
+ 0.5t
c(SYS)
t
f
SYSCLK or MCLK
(4)
0.5t
c(SYS)
t
r
2
t
w(COH)
Pulse duration, CLKOUT high
ICLK, X is even or 1
(5)
0.5t
c(ICLK)
t
r
ns
ICLK, X is odd and not 1
(5)
0.5t
c(ICLK)
0.5t
c(SYS)
t
r
N is even and X is even or odd
0.5t
c(ECLK)
t
f
3
t
w(EOL)
Pulse duration, ECLK low
N is odd and X is even
0.5t
c(ECLK)
t
f
ns
N is odd and X is odd and not 1
0.5t
c(ECLK)
+ 0.5t
c(SYS)
t
f
N is even and X is even or odd
0.5t
c(ECLK)
t
r
4
t
w(EOH)
Pulse duration, ECLK high
N is odd and X is even
0.5t
c(ECLK)
t
r
ns
N is odd and X is odd and not 1
0.5t
c(ECLK)
0.5t
c(SYS)
t
r
(1)
X = {1,2,3,4,5,6,7,8,9,10,11,12,13,14,15,16}. X is the interface clock divider ratio determined by the PCR0.[4:1] bits in the SYS module.
(2)
N = {1 to 256}. N is the ECP prescale value defined by the ECPCTRL.[7:0] register bits in the ECP module.
(3)
CLKOUT/ECLK pulse durations (low/high) are a function of the OSCIN pulse durations when PLLDIS is active.
(4)
Clock source bits selected as either SYSCLK (CLKCNTL.[6:5] = 11 binary) or MCLK (CLKCNTL.[6:5] = 10 binary).
(5)
Clock source bits selected as ICLK (CLKCNTL.[6:5] = 01 binary).
Figure 6. CLKOUT Timing Diagram
Figure 7. ECLK Timing Diagram
26
www.ti.com
RST and PORRST timings
timing requirements for PORRST
V
CCP
/V
CCIO
V
CC
V
CC
V
CCP
/V
CCIO
10
8
6
5
3
7
6
9
V
CCPORH
V
CCIOPORL
V
IL(PORRST)
V
CCIOPORH
7
V
CCIOPORH
V
CCIOPORL
V
CCPORL
V
CC
11
PORRST
V
CCIO
V
CCPORH
V
CCPORL
V
IL
V
IL
V
IL
V
IL
V
IL(PORRST)
switching characteristics over recommended operating conditions for RST
(1)
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
(see Figure 8)
NO.
MIN
MAX
UNIT
V
CCPORL
V
CC
low supply level when PORRST must be active during power up
0.6
V
V
CC
high supply level when PORRST must remain active during power up
V
CCPORH
1.5
V
and become active during power down
V
CCIOPORL
V
CCIO
low supply level when PORRST must be active during power up
1.1
V
V
CCIO
high supply level when PORRST must remain active during power
V
CCIOPORH
2.75
V
up and become active during power down
V
IL
Low-level input voltage after V
CCIO
> V
CCIOPORH
0.2 V
CCIO
V
V
IL(PORRST)
Low-level input voltage of PORRST before V
CCIO
> V
CCIOPORL
0.5
V
3
t
su(PORRST)r
Setup time, PORRST active before V
CCIO
> V
CCIOPORL
during power up
0
ms
5
t
su(VCCIO)r
Setup time, V
CCIO
> V
CCIOPORL
before V
CC
> V
CCPORL
0
ms
6
t
h(PORRST)r
Hold time, PORRST active after V
CC
> V
CCPORH
1
ms
7
t
su(PORRST)f
Setup time, PORRST active before V
CC
V
CCPORH
during power down
8
ms
8
t
h(PORRST)rio
Hold time, PORRST active after V
CC
> V
CCIOPORH
1
ms
9
t
h(PORRST)d
Hold time, PORRST active after V
CC
< V
CCPORL
0
ms
10
t
su(PORRST)fio
Setup time, PORRST active before V
CC
V
CCIOPORH
during power down
0
ms
11
t
su(VCCIO)f
Setup time, V
CC
< V
CCPORE
before V
CCIO
< V
CCIOPORL
0
ms
Figure 8. PORRST Timing Diagram
PARAMETER
MIN
MAX
UNIT
Valid time, RST active after PORRST inactive
4112t
c(OSC)
t
v(RST)
ns
Valid time, RST active (all others)
8t
c(SYS)
(1)
Specified values do NOT include rise/fall times. For rise and fall timings, see the "switching characteristics for output timings versus load
capacitance" table.
27
www.ti.com
JTAG scan interface timing
1
1
2
3
4
5
TMS
TDI
TDO
TCK
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
(JTAG clock specification 10-MHz and 50-pF load on TDO output) (see Figure 9)
NO.
MIN
MAX
UNIT
1
t
c(JTAG)
Cycle time, JTAG low and high period
50
ns
2
t
su(TDI/TMS - TCKr)
Setup time, TDI, TMS before TCK rise (TCKr)
15
ns
3
t
h(TCKr -TDI/TMS)
Hold time, TDI, TMS after TCKr
15
ns
4
t
h(TCKf -TDO)
Hold time, TDO after TCKf
10
ns
5
t
d(TCKf -TDO)
Delay time, TDO valid after TCK fall (TCKf)
45
ns
Figure 9. JTAG Scan Timing
28
www.ti.com
output timings
switching characteristics for output timings versus load capacitance (C
L
)
t
f
t
r
V
CC
80%
80%
20%
20%
0
Output
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
(see Figure 10)
PARAMETER
MIN
MAX
UNIT
C
L
= 15 pF
0.5
2.50
C
L
= 50 pF
1.5
5
t
r
Rise time, CLKOUT, AWD, TDO
ns
C
L
= 100 pF
3
9
C
L
= 150 pF
4.5
12.5
C
L
= 15 pF
0.5
2.5
C
L
= 50 pF
1.5
5
t
f
Fall time, CLKOUT, AWD, TDO
ns
C
L
= 100 pF
3
9
C
L
= 150 pF
4.5
12.5
C
L
= 15 pF
2.5
8
C
L
= 50 pF
5
14
t
r
Rise time, SPInCLK, SPInSOMI, SPInSIMO
(1)
ns
C
L
= 100 pF
9
23
C
L
= 150 pF
13
32
C
L
= 15 pF
2.5
8
C
L
= 50 pF
5
14
t
f
Fall time, RST, SPInCLK, SPInSOMI, SPInSIMO
(1)
ns
C
L
= 100 pF
9
23
C
L
= 150 pF
13
32
C
L
= 15 pF
2.5
10
C
L
= 50 pF
6.0
25
t
r
Rise time, all other output pins
ns
C
L
= 100 pF
12
45
C
L
= 150 pF
18
65
C
L
= 15 pF
3
10
C
L
= 50 pF
8.5
25
t
f
Fall time, all other output pins
ns
C
L
= 100 pF
16
45
C
L
= 150 pF
23
65
(1)
n = 1 and 2
Figure 10. CMOS-Level Outputs
29
www.ti.com
input timings
timing requirements for input timings
(1)
Input
t
pw
V
CC
80%
80%
20%
20%
0
Flash timings
timing requirements for program Flash
(1)
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
(see Figure 11)
MIN
MAX
UNIT
t
pw
Input minimum pulse width
t
c(ICLK)
+ 10
ns
(1)
t
c(ICLK)
= interface clock cycle time = 1 / f
(ICLK)
Figure 11. CMOS-Level Inputs
MIN
TYP
MAX
UNIT
t
prog(16-bit)
Half word (16-bit) programming time
4
16
200
s
t
prog(Total)
256K-byte programming time
(2)
2
8
s
t
erase(sector)
Sector erase time
2
15
s
t
wec
Write/erase cycles at T
A
= 125
C
100 cycles
(1)
For more detailed information on the Flash core sectors, see the Flash program and erase section of this data sheet.
(2)
The 256K-byte programming times include overhead of state machine.
30
www.ti.com
SPIn master mode timing parameters
SPIn MASTER MODE EXTERNAL TIMING PARAMETERS
7
4
SPInSOMI
SPInSIMO
SPInCLK
(clock polarity = 1)
SPInCLK
(clock polarity = 0)
Master In Data
Must Be Valid
Master Out Data Is Valid
6
5
1
2
3
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
(CLOCK PHASE = 0, SPInCLK = output, SPInSIMO = output, and SPInSOMI = input)
(1) (2) (3)
(see Figure 12)
NO.
MIN
MAX
UNIT
1
t
c(SPC)M
Cycle time, SPInCLK
(4)
100
256t
c(ICLK)
ns
t
w(SPCH)M
Pulse duration, SPInCLK high (clock polarity = 0)
0.5t
c(SPC)M
- t
r
0.5t
c(SPC)M
+ 5
2
(5)
ns
t
w(SPCL)M
Pulse duration, SPInCLK low (clock polarity = 1)
0.5t
c(SPC)M
- t
f
0.5t
c(SPC)M
+ 5
t
w(SPCL)M
Pulse duration, SPInCLK low (clock polarity = 0)
0.5t
c(SPC)M
- t
f
0.5t
c(SPC)M
+ 5
3
(5)
ns
t
w(SPCH)M
Pulse duration, SPInCLK high (clock polarity = 1)
0.5t
c(SPC)M
- t
r
0.5t
c(SPC)M
+ 5
t
d(SPCH-SIMO)M
Delay time, SPInCLK high to SPInSIMO valid (clock polarity = 0)
10
4
(5)
ns
t
d(SPCL-SIMO)M
Delay time, SPInCLK low to SPInSIMO valid (clock polarity = 1)
10
Valid time, SPInSIMO data valid after SPInCLK low
t
v(SPCL-SIMO)M
t
c(SPC)M
- 5 - t
f
(clock polarity = 0)
5
(5)
ns
Valid time, SPInSIMO data valid after SPInCLK high
t
v(SPCH-SIMO)M
t
c(SPC)M
- 5 - t
r
(clock polarity = 1)
t
su(SOMI-SPCL)M
Setup time, SPInSOMI before SPInCLK low (clock polarity = 0)
6
6
(5)
ns
t
su(SOMI-SPCH)M
Setup time, SPInSOMI before SPInCLK high (clock polarity = 1)
6
Valid time, SPInSOMI data valid after SPInCLK low
t
v(SPCL-SOMI)M
4
(clock polarity = 0)
7
(5)
ns
Valid time, SPInSOMI data valid after SPInCLK high
t
v(SPCH-SOMI)M
4
(clock polarity = 1)
(1)
The MASTER bit (SPInCTRL2.3) is set and the CLOCK PHASE bit (SPInCTRL2.0) is cleared.
(2)
t
c(ICLK)
= interface clock cycle time = 1 / f
(ICLK)
(3)
For rise and fall timings, see the "switching characteristics for output timings versus load capacitance" table.
(4)
When the SPI is in master mode, the following must be true:
For PS values from 1 to 255: t
c(SPC)M
(PS +1)t
c(ICLK)
100 ns, where PS is the prescale value set in the SPInCTL1.[12:5] register bits.
For PS values of 0: t
c(SPC)M
= 2t
c(ICLK)
100 ns.
(5)
The active edge of the SPInCLK signal referenced is controlled by the CLOCK POLARITY bit (SPInCTRL2.1).
Figure 12. SPIn Master Mode External Timing (CLOCK PHASE = 0)
31
www.ti.com
SPIn MASTER MODE EXTERNAL TIMING PARAMETERS
Data Valid
7
SPInSOMI
SPInSIMO
SPInCLK
(clock polarity = 1)
SPInCLK
(clock polarity = 0)
Master In Data
Must Be Valid
Master Out Data Is Valid
1
5
4
6
3
2
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
(CLOCK PHASE = 1, SPInCLK = output, SPInSIMO = output, and SPInSOMI = input)
(1) (2) (3)
(see Figure 13)
NO.
MIN
MAX
UNIT
1
t
c(SPC)M
Cycle time, SPInCLK
(4)
100
256t
c(ICLK)
ns
t
w(SPCH)M
Pulse duration, SPInCLK high (clock polarity = 0)
0.5t
c(SPC)M
- t
r
0.5t
c(SPC)M
+ 5
2
(5)
ns
t
w(SPCL)M
Pulse duration, SPInCLK low (clock polarity = 1)
0.5t
c(SPC)M
- t
f
0.5t
c(SPC)M
+ 5
t
w(SPCL)M
Pulse duration, SPInCLK low (clock polarity = 0)
0.5t
c(SPC)M
- t
f
0.5t
c(SPC)M
+ 5
3
(5)
ns
t
w(SPCH)M
Pulse duration, SPInCLK high (clock polarity = 1)
0.5t
c(SPC)M
- t
r
0.5t
c(SPC)M
+ 5
Valid time, SPInCLK high after SPInSIMO data valid
t
v(SIMO-SPCH)M
0.5t
c(SPC)M
- 10
(clock polarity = 0)
4
(5)
ns
Valid time, SPInCLK low after SPInSIMO data valid
t
v(SIMO-SPCL)M
0.5t
c(SPC)M
- 10
(clock polarity = 1)
Valid time, SPInSIMO data valid after SPInCLK high
t
v(SPCH-SIMO)M
t
c(SPC)M
- 5 - t
f
(clock polarity = 0)
5
(5)
ns
Valid time, SPInSIMO data valid after SPInCLK low
t
v(SPCL-SIMO)M
t
c(SPC)M
- 5 - t
r
(clock polarity = 1)
t
su(SOMI-SPCH)M
Setup time, SPInSOMI before SPInCLK high (clock polarity = 0)
6
6
(5)
ns
t
su(SOMI-SPCL)M
Setup time, SPInSOMI before SPInCLK low (clock polarity = 1)
6
Valid time, SPInSOMI data valid after SPInCLK high
t
v(SPCH-SOMI)M
4
(clock polarity = 0)
7
(5)
ns
Valid time, SPInSOMI data valid after SPInCLK low
t
v(SPCL-SOMI)M
4
(clock polarity = 1)
(1)
The MASTER bit (SPInCTRL2.3) is set and the CLOCK PHASE bit (SPInCTRL2.0) is set.
(2)
t
c(ICLK)
= interface clock cycle time = 1 / f
(ICLK)
(3)
For rise and fall timings, see the "switching characteristics for output timings versus load capacitance" table.
(4)
When the SPI is in master mode, the following must be true:
For PS values from 1 to 255: t
c(SPC)M
(PS +1)t
c(ICLK)
100 ns, where PS is the prescale value set in the SPInCTL1.[12:5] register bits.
For PS values of 0: t
c(SPC)M
= 2t
c(ICLK)
100 ns.
(5)
The active edge of the SPInCLK signal referenced is controlled by the CLOCK POLARITY bit (SPInCTRL2.1).
Figure 13. SPIn Master Mode External Timing (CLOCK PHASE = 1)
32
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SPIn SLAVE MODE TIMING PARAMETERS
SPIn SLAVE MODE EXTERNAL TIMING PARAMETERS
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
(CLOCK PHASE = 0, SPInCLK = input, SPInSIMO = input, and SPInSOMI = output)
(1) (2) (3) (4)
(see Figure 14)
NO.
MIN
MAX
UNIT
1
t
c(SPC)S
Cycle time, SPInCLK
(5)
100
256t
c(ICLK)
ns
Pulse duration, SPInCLK high
t
w(SPCH)S
0.5t
c(SPC)S
- 0.25t
c(ICLK)
0.5t
c(SPC)S
+ 0.25t
c(ICLK)
(clock polarity = 0)
2
(6)
ns
Pulse duration, SPInCLK low
t
w(SPCL)S
0.5t
c(SPC)S
- 0.25t
c(ICLK)
0.5t
c(SPC)S
+ 0.25t
c(ICLK)
(clock polarity = 1)
Pulse duration, SPInCLK low
t
w(SPCL)S
0.5t
c(SPC)S
- 0.25t
c(ICLK)
0.5t
c(SPC)S
+ 0.25t
c(ICLK)
(clock polarity = 0)
3
(6)
ns
Pulse duration, SPInCLK high
t
w(SPCH)S
0.5t
c(SPC)S
- 0.25t
c(ICLK)
0.5t
c(SPC)S
+ 0.25t
c(ICLK)
(clock polarity = 1)
Delay time, SPInCLK high to
t
d(SPCH-SOMI)S
6 + t
r
SPInSOMI valid (clock polarity = 0)
4
(6)
ns
Delay time, SPInCLK low to
t
d(SPCL-SOMI)S
6 + t
f
SPInSOMI valid (clock polarity = 1)
Valid time, SPInSOMI data valid after
t
v(SPCH-SOMI)S
t
c(SPC)S
- 6 - t
r
SPInCLK high (clock polarity = 0)
5
(6)
ns
Valid time, SPInSOMI data valid after
t
v(SPCL-SOMI)S
t
c(SPC)S
- 6 - t
f
SPInCLK low (clock polarity = 1)
Setup time, SPInSIMO before
t
su(SIMO-SPCL)S
6
SPInCLK low (clock polarity = 0)
6
(6)
ns
Setup time, SPInSIMO before
t
su(SIMO-SPCH)S
6
SPInCLK high (clock polarity = 1)
Valid time, SPInSIMO data valid after
t
v(SPCL-SIMO)S
6
SPInCLK low (clock polarity = 0)
7
(6)
ns
Valid time, SPInSIMO data valid after
t
v(SPCH-SIMO)S
6
SPInCLK high (clock polarity = 1)
(1)
The MASTER bit (SPInCTRL2.3) is cleared and the CLOCK PHASE bit (SPInCTRL2.0) is cleared.
(2)
If the SPI is in slave mode, the following must be true: t
c(SPC)S
(PS + 1) t
c(ICLK)
, where PS = prescale value set in SPInCTL1.[12:5].
(3)
For rise and fall timings, see the "switching characteristics for output timings versus load capacitance" table.
(4)
t
c(ICLK)
= interface clock cycle time = 1 /f
(ICLK)
(5)
When the SPIn is in slave mode, the following must be true:
For PS values from 1 to 255: t
c(SPC)S
(PS +1)t
c(ICLK)
100 ns, where PS is the prescale value set in the SPInCTL1.[12:5] register bits.
For PS values of 0: t
c(SPC)S
= 2t
c(ICLK)
100 ns.
(6)
The active edge of the SPInCLK signal referenced is controlled by the CLOCK POLARITY bit (SPInCTRL2.1).
33
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7
4
SPInSIMO
SPInSOMI
SPInCLK
(clock polarity = 1)
SPInCLK
(clock polarity = 0)
SPISIMO Data
Must Be Valid
SPISOMI Data Is Valid
6
5
3
2
1
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Figure 14. SPIn Slave Mode External Timing (CLOCK PHASE = 0)
34
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SPIn SLAVE MODE EXTERNAL TIMING PARAMETERS
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
(CLOCK PHASE = 1, SPInCLK = input, SPInSIMO = input, and SPInSOMI = output)
(1) (2) (3) (4)
(see Figure 15)
NO.
MIN
MAX
UNIT
1
t
c(SPC)S
Cycle time, SPInCLK
(5)
100
256t
c(ICLK)
ns
Pulse duration, SPInCLK high
t
w(SPCH)S
0.5t
c(SPC)S
- 0.25t
c(ICLK)
0.5t
c(SPC)S
+ 0.25t
c(ICLK)
(clock polarity = 0)
2
(6)
ns
Pulse duration, SPInCLK low
t
w(SPCL)S
0.5t
c(SPC)S
- 0.25t
c(ICLK)
0.5t
c(SPC)S
+ 0.25t
c(ICLK)
(clock polarity = 1)
Pulse duration, SPInCLK low
t
w(SPCL)S
0.5t
c(SPC)S
- 0.25t
c(ICLK)
0.5t
c(SPC)S
+ 0.25t
c(ICLK)
(clock polarity = 0)
3
(6)
ns
Pulse duration, SPInCLK high
t
w(SPCH)S
0.5t
c(SPC)S
- 0.25t
c(ICLK)
0.5t
c(SPC)S
+ 0.25t
c(ICLK)
(clock polarity = 1)
Valid time, SPInCLK high after
t
v(SOMI-SPCH)S
0.5t
c(SPC)S
- 6 - t
r
SPInSOMI data valid (clock polarity = 0)
4
(6)
ns
Valid time, SPInCLK low after
t
v(SOMI-SPCL)S
0.5t
c(SPC)S
- 6 - t
f
SPInSOMI data valid (clock polarity = 1)
Valid time, SPInSOMI data valid after
t
v(SPCH-SOMI)S
0.5t
c(SPC)S
- 6 - t
r
SPInCLK high (clock polarity = 0)
5
(6)
ns
Valid time, SPInSOMI data valid after
t
v(SPCL-SOMI)S
0.5t
c(SPC)S
- 6 - t
f
SPInCLK low (clock polarity = 1)
Setup time, SPInSIMO before SPInCLK
t
su(SIMO-SPCH)S
6
high (clock polarity = 0)
6
(6)
ns
Setup time, SPInSIMO before SPInCLK
t
su(SIMO-SPCL)S
6
low (clock polarity = 1)
Valid time, SPInSIMO data valid after
t
v(SPCH-SIMO)S
6
SPInCLK high (clock polarity = 0)
7
(6)
ns
Valid time, SPInSIMO data valid after
t
v(SPCL-SIMO)S
6
SPInCLK low (clock polarity = 1)
(1)
The MASTER bit (SPInCTRL2.3) is cleared and the CLOCK PHASE bit (SPInCTRL2.0) is set.
(2)
If the SPI is in slave mode, the following must be true: t
c(SPC)S
(PS + 1) t
c(ICLK)
, where PS = prescale value set in SPInCTL1.[12:5].
(3)
For rise and fall timings, see the "switching characteristics for output timings versus load capacitance" table.
(4)
t
c(ICLK)
= interface clock cycle time = 1 /f
(ICLK)
(5)
When the SPIn is in slave mode, the following must be true:
For PS values from 1 to 255: t
c(SPC)S
(PS +1)t
c(ICLK)
100 ns, where PS is the prescale value set in the SPInCTL1.[12:5] register bits.
For PS values of 0: t
c(SPC)S
= 2t
c(ICLK)
100 ns.
(6)
The active edge of the SPInCLK signal referenced is controlled by the CLOCK POLARITY bit (SPInCTRL2.1).
35
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Data Valid
7
SPInSIMO
SPInSOMI
SPInCLK
(clock polarity = 1)
SPInCLK
(clock polarity = 0)
SPISIMO Data Must
Be Valid
SPISOMI Data Is Valid
6
1
5
4
3
2
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Figure 15. SPIn Slave Mode External Timing (CLOCK PHASE = 1)
36
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SCIn ISOSYNCHRONOUS MODE TIMINGS INTERNAL CLOCK
timing requirements for internal clock SCIn isosynchronous mode
(1) (2) (3)
1
2
3
6
7
Data Valid
SCICLK
SCITX
SCIRX
5
4
Data Valid
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
(see Figure 16)
(BAUD + 1)
(BAUD + 1)
IS EVEN OR BAUD = 0
IS ODD AND BAUD
0
NO.
UNIT
MIN
MAX
MIN
MAX
1
t
c(SCC)
Cycle time, SCInCLK
2t
c(ICLK)
2
24
t
c(ICLK)
3t
c(ICLK)
(2
24
-1) t
c(ICLK)
ns
Pulse duration,
2
t
w(SCCL)
0.5t
c(SCC)
- t
f
0.5t
c(SCC)
+ 5
0.5t
c(SCC)
+ 0.5t
c(ICLK)
- t
f
0.5t
c(SCC)
+ 0.5t
c(ICLK)
ns
SCInCLK low
Pulse duration,
3
t
w(SCCH)
0.5t
c(SCC)
- t
r
0.5t
c(SCC)
+ 5
0.5t
c(SCC)
- 0.5t
c(ICLK)
- t
r
0.5t
c(SCC)
- 0.5t
c(ICLK)
ns
SCInCLK high
Delay time, SCInCLK
4
t
d(SCCH-TXV)
10
10
ns
high to SCInTX valid
Valid time, SCInTX
5
t
v(TX)
data after SCInCLK
t
c(SCC)
- 10
t
c(SCC)
- 10
ns
low
Setup time, SCInRX
6
t
su(RX-SCCL)
t
c(ICLK)
+ t
f
+ 20
t
c(ICLK)
+ t
f
+ 20
ns
before SCInCLK low
Valid time, SCInRX
7
t
v(SCCL-RX)
data after SCInCLK
- t
c(ICLK)
+ t
f
+ 20
- t
c(ICLK)
+ t
f
+ 20
ns
low
(1)
BAUD = 24-bit concatenated value formed by the SCI[H,M,L]BAUD registers.
(2)
t
c(ICLK)
= interface clock cycle time = 1 / f
(ICLK)
(3)
For rise and fall timings, see the "switching characteristics for output timings versus load capacitance" table.
A.
Data transmission/reception characteristics for isosynchronous mode with external clocking are similar to the
asynchronous mode. Data transmission occurs on the SCICLK rising edge, and data reception on the SCICLK falling
edge.
Figure 16. SCIn Isosynchronous Mode Timing Diagram for Internal Clock
37
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SCIn isosynchronous mode timings -- external clock
timing requirements for external clock SCIn isosynchronous mode
(1) (2)
1
3
2
6
7
Data Valid
Data Valid
SCICLK
SCITX
SCIRX
5
4
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
(see Figure 17)
NO.
MIN
MAX
UNIT
1
t
c(SCC)
Cycle time, SCInCLK
(3)
8t
c(ICLK)
ns
2
t
w(SCCH)
Pulse duration, SCInCLK high
0.5t
c(SCC)
- 0.25t
c(ICLK)
0.5t
c(SCC)
+ 0.25t
c(ICLK)
ns
3
t
w(SCCL)
Pulse duration, SCInCLK low
0.5t
c(SCC)
- 0.25t
c(ICLK)
0.5t
c(SCC)
+ 0.25t
c(ICLK)
ns
4
t
d(SCCH-TXV)
Delay time, SCInCLK high to SCInTX valid
2t
c(ICLK)
+ 12 + t
r
ns
5
t
v(TX)
Valid time, SCInTX data after SCInCLK low
2t
c(SCC)
- 10
ns
6
t
su(RX-SCCL)
Setup time, SCInRX before SCInCLK low
0
ns
7
t
v(SCCL-RX)
Valid time, SCInRX data after SCInCLK low
2t
c(ICLK)
+ 10
ns
(1)
t
c(ICLK)
= interface clock cycle time = 1 / f
(ICLK)
(2)
For rise and fall timings, see the "switching characteristics for output timings versus load capacitance" table.
(3)
When driving an external SCInCLK, the following must be true: t
c(SCC)
8t
c(ICLK)
A.
Data transmission/reception characteristics for isosynchronous mode with external clocking are similar to the
asynchronous mode. Data transmission occurs on the SCICLK rising edge, and data reception on the SCICLK falling
edge.
Figure 17. SCIn Isosynchronous Mode Timing Diagram for External Clock
38
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HIGH-END TIMER (HET) TIMINGS
Minimum PWM output pulse width:
Minimum input pulses we can capture:
standard CAN controller (SCC) mode timings
dynamic characteristics for the CANSTX and CANSRX pins
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
This is equal to one high resolution clock period (HRP). The HRP is defined by the 6-bit high resolution prescale
factor (hr), which is user defined, giving prescale factors of 1 to 64 with a linear increment of codes.
Therefore, the minimum PWM output pulse width = HRP(min) = hr(min)/SYSCLK = 1/SYSCLK
For example, for a SYSCLK of 30 MHz, the minimum PWM output pulse width = 1/30 = 33.33ns
The input pulse width must be greater or equal to the low resolution clock period (LRP), i.e., the HET loop (the
HET program must fit within the LRP). The LRP is defined by the 3-bit loop-resolution prescale factor (lr), which
is user defined, with a power of 2 increment of codes. That is, the value of lr can be 1, 2, 4, 8, 16, or 32.
Therefore, the minimum input pulse width = LRP(min) = hr(min) * lr(min)/SYSCLK = 1 * 1/SYSCLK
For example, with a SYSCLK of 30 MHz, the minimum input pulse width = 1 * 1/30 = 33.33 ns
NOTE:
Once the input pulse width is greater than LRP, the resolution of the measurement is
still HRP. (That is, the captured value gives the number of HRP clocks inside the
pulse.)
Abbreviations:
hr = HET high resolution divide rate = 1, 2, 3,...63, 64
lr = HET low resolution divide rate = 1, 2, 4, 8, 16, 32
High resolution clock period = HRP = hr/SYSCLK
Loop resolution clock period = LRP = hr*lr/SYSCLK
PARAMETER
MIN
MAX
UNIT
t
d
(CANSTX)
Delay time, transmit shift register to CANSTX pin
(1)
15
ns
t
d
(CANSRX)
Delay time, CANSRX pin to receive shift register
5
ns
(1)
These values do not include the rise/fall times of the output buffer.
39
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MULTI-BUFFERED A-TO-D CONVERTER (MibADC)
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
The multi-buffered A-to-D converter (MibADC) has a separate power bus for its analog circuitry. This power bus
enhances the A-to-D performance by preventing digital switching noise on the logic circuitry which could be
present on VSS and VCC from coupling into the A-to-D analog stage. All A-to-D specifications are given with
respect to ADREFLO unless otherwise noted.
Resolution
10 bits (1024 values)
Monotonic
Assured
Output conversion code
00h to 3FFh [00 for VAI
AD
REFLO
; 3FF for VAI
AD
REFHI
]
Table 14. MibADC RECOMMENDED OPERATING CONDITIONS
(1)
MIN
MAX
UNIT
AD
REFHI
A-to-D high-voltage reference source
V
SSAD
V
CCAD
V
AD
REFLO
A-to-D low-voltage reference source
V
SSAD
V
CCAD
V
V
AI
Analog input voltage
V
SSAD
- 0.3
V
CCAD
+ 0.3
V
Analog input clamp current
(2)
I
AIC
-2
2
mA
(V
AI
< V
SSAD
- 0.3 or V
AI
> V
CCAD
+ 0.3)
(1)
For V
CCAD
and V
SSAD
recommended operating conditions, see the "device recommended operating conditions" table.
(2)
Input currents into any ADC input channel outside the specified limits could affect conversion results of other channels.
Table 15. OPERATING CHARACTERISTICS OVER FULL RANGES OF RECOMMENDED OPERATING
CONDITIONS
(1) (2)
PARAMETER
DESCRIPTION/CONDITIONS
MIN
TYP
MAX UNIT
R
i
Analog input resistance
See Figure 18.
250
500
Conversion
10
pF
C
i
Analog input capacitance
See Figure 18.
Sampling
30
pF
I
AIL
Analog input leakage current
See Figure 18.
-1
1
A
I
ADREFHI
AD
REFHI
input current
AD
REFHI
= 3.6 V, AD
REFLO
= V
SSAD
5
mA
Conversion range over which specified
CR
AD
REFHI
- AD
REFLO
3
3.6
V
accuracy is maintained
Difference between the actual step width and the ideal
E
DNL
Differential nonlinearity error
2
LSB
value after offset correction. See Figure 19.
Maximum deviation from the best straight line through
the MibADC. MibADC transfer characteristics, exclud-
E
INL
Integral nonlinearity error
2
LSB
ing the quantization error after offset correction. See
Figure 20.
Maximum value of the difference between an analog
E
TOT
Total error/Absolute accuracy
2
LSB
value and the ideal midstep value. See Figure 21.
(1)
V
CCIO
= V
CCAD
= AD
REFHI
(2)
1 LSB = (AD
REFHI
- AD
REFLO
)/ 2
10
for the MibADC
40
www.ti.com
Parasitic
Capacitance
V
src
R
i
MibADC
Input Pin
R
s
Sample
Capacitor
C
i
R
leak
Sample Switch
External
Analog Input Value (LSB)
Digital Output Code
Differential
Linearity Error (1/2 LSB)
1 LSB
Differential Linearity
Error (
1/2 LSB)
1 LSB
0
1
2
3
4
5
0 ... 101
0 ... 100
0 ... 011
0 ... 010
0 ... 001
0 ... 000
0 ... 110
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
Figure 18. MibADC Input Equivalent Circuit
Table 16. MULTI-BUFFER ADC TIMING REQUIREMENTS
MIN
MAX
UNIT
t
c(ADCLK)
Cycle time, MibADC clock
0.05
s
t
d(SH)
Delay time, sample and hold time
1
s
t
d(C)
Delay time, conversion time
0.55
s
t
d(SHC)
(1)
Delay time, total sample/hold and conversion time
1.55
s
(1)
This is the minimum sample/hold and conversion time that can be achieved. These parameters are dependent on many factors for more
detail; see the TMS470R1x Multi-Buffered Analog-to-Digital Converter (MibADC) Reference Guide (literature number SPNU206).
The differential nonlinearity error shown in Figure 19 (sometimes referred to as differential linearity) is the
difference between an actual step width and the ideal value of 1 LSB.
A.
1 LSB = (AD
REFHI
- AD
REFLO
)/2
10
Figure 19. Differential Nonlinearity (DNL)
41
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0
1
2
3
4
5
6
7
At Transition
011/100
(
1/2 LSB)
End-Point Lin. Error
At Transition
001/010 (
1/4 LSB)
Ideal
Transition
Actual
Transition
0 ... 101
0 ... 100
0 ... 011
0 ... 010
0 ... 111
0 ... 110
Digital Output Code
0 ... 001
0 ... 000
Analog Input Value (LSB)
0
1
2
3
4
5
6
7
0 ... 101
0 ... 100
0 ... 011
0 ... 010
0 ... 001
0 ... 000
0 ... 111
0 ... 110
Analog Input Value (LSB)
Digital Output Code
Total Error
At Step
0 ... 001 ( 1/2 LSB)
Total Error
At Step 0 ... 101
(
1 1/4 LSB)
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
The integral nonlinearity error shown in Figure 20 (sometimes referred to as linearity error) is the deviation of the
values on the actual transfer function from a straight line.
A.
1 LSB = (AD
REFHI
- AD
REFLO
)/2
10
Figure 20. Integral Nonlinearity (INL) Error
The absolute accuracy or total error of an MibADC as shown in Figure 21 is the maximum value of the difference
between an analog value and the ideal midstep value.
A.
1 LSB = (AD
REFHI
- AD
REFLO
)/2
10
Figure 21. Absolute Accuracy (Total) Error
42
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Thermal Characteristics
TMS470R1A256
16/32-Bit RISC Flash Microcontroller
SPNS100 NOVEMBER 2004
PARAMETER
C/W
R
JA
51
R
JC
5
43
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package
Type
Package
Drawing
Pins Package
Qty
Eco Plan
(2)
Lead/Ball Finish
MSL Peak Temp
(3)
TMS470R1A256PZ
ACTIVE
LQFP
PZ
100
1
TBD
Call TI
Call TI
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco
Plan
-
The
planned
eco-friendly
classification:
Pb-Free
(RoHS)
or
Green
(RoHS
&
no
Sb/Br)
-
please
check
http://www.ti.com/productcontent
for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
PACKAGE OPTION ADDENDUM
www.ti.com
30-Mar-2005
Addendum-Page 1
MECHANICAL DATA

MTQF013A OCTOBER 1994 REVISED DECEMBER 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PZ (S-PQFP-G100)
PLASTIC QUAD FLATPACK
4040149 /B 11/96
50
26
0,13 NOM
Gage Plane
0,25
0,45
0,75
0,05 MIN
0,27
51
25
75
1
12,00 TYP
0,17
76
100
SQ
SQ
15,80
16,20
13,80
1,35
1,45
1,60 MAX
14,20
0
7
Seating Plane
0,08
0,50
M
0,08
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Falls within JEDEC MS-026
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