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Электронный компонент: Am29BDS643G

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ADVANCE INFORMATION
This document contains information on a product under development at Advanced Micro Devices. The information
is intended to help you evaluate this product. AMD reserves the right to change or discontinue work on this proposed
product without notice.
Publication# 25692
Rev: A Amendment+1
Issue Date: November 9, 2001
Refer to AMD's Website (www.amd.com) for the latest information.
Am29BDS643G
64 Megabit (4 M x 16-Bit)
CMOS 1.8 Volt-only Simultaneous Read/Write, Burst Mode Flash Memory
DISTINCTIVE CHARACTERISTICS
s
Single 1.8 volt read, program and erase (1.7 to
1.9 volt)
s
Multiplexed Data and Address for reduced I/O
count
-- A0A15 multiplexed as D0D15
-- Addresses are latched by AVD# control input
when CE# low
s
Simultaneous Read/Write operation
-- Data can be continuously read from one bank
while executing erase/program functions in
other bank
-- Zero latency between read and write operations
s
Read access times at 66/54/40 MHz
-- Burst access times of 11/13.5/20 ns @ 30 pF
at industrial temperature range
-- Asynchronous random access times
of 55/70/70 ns @ 30 pF
-- Synchronous random access times
of 71/87.5/95 ns @ 30 pF
s
Burst length
-- Continuous linear burst
-- 8/16/32 word linear burst with wrap around
s
Power dissipation (typical values, 8 bits
switching, C
L
= 30 pF)
-- Burst Mode Read: 25 mA
-- Simultaneous Operation: 40 mA
-- Program/Erase: 15 mA
-- Standby mode: 0.2 A
s
Sector Architecture
-- Eight 8 Kword sectors and one hundred
twenty-six 32 Kword sectors
-- Banks A and B each contain four 8 Kword
sectors and thirty-one 32 Kword sectors; Banks
C and D each contain thirty-two 32 Kword
sectors
s
Sector Protection
-- Software command sector locking
-- WP# protects the last two boot sectors
-- All sectors locked when V
PP
= V
IL
s
Handshaking feature
-- Provides host system with minimum possible
latency by monitoring RDY
s
Supports Common Flash Memory
Interface (CFI)
s
Software command set compatible with JEDEC
42.4 standards
-- Backwards compatible with Am29F and
Am29LV families
s
Manufactured on 0.17 m process technology
s
Minimum 1 million erase cycle guarantee
per sector
s
20-year data retention at 125
C
-- Reliable operation for the life of the system
s
Embedded Algorithms
-- Embedded Erase algorithm automatically
preprograms and erases the entire chip or any
combination of designated sectors
-- Embedded Program algorithm automatically
writes and verifies data at specified addresses
s
Data# Polling and toggle bits
-- Provides a software method of detecting
program and erase operation completion
s
Erase Suspend/Resume
-- Suspends an erase operation to read data from,
or program data to, a sector that is not being
erased, then resumes the erase operation
s
Hardware reset input (RESET#)
-- Hardware method to reset the device for reading
array data
s
CMOS compatible inputs and outputs
s
Package
-- 44-ball Very Thin FBGA
2
Am29BDS643G
November 9, 2001
A D V A N C E I N F O R M A T I O N
GENERAL DESCRIPTION
The Am29BDS643G is a 64 Mbit, 1.8 Volt-only, simul-
taneous Read/Write, Burst Mode Flash memory
device, organized as 4,194,304 words of 16 bits each.
This device uses a single V
CC
of 1.7 to 1.9 V to read,
program, and erase the memory array. A 12.0-volt V
PP
may be used for faster program performance if desired.
The device can also be programmed in standard
EPROM programmers.
At 66 MHz, the Am29N643 provides a burst access of
11 ns at 30 pF with initial access times of 71 ns at 30
pF. At 54 MHz, the device provides a burst access of
13.5 ns at 30 pF with initial access times of 87.5 ns at
30 pF. At 40 MHz, the device provides a burst access
of 20 ns at 30 pF with initial access times of 95 ns at 30
pF. The device operates within the industrial tempera-
ture range of 40
C to +85
C. The device is offered in
the 44-ball Very Thin FBGA package.
Simultaneous Read/Write Operations with
Zero Latency
The Simultaneous Read/Write architecture provides
simultaneous operation by dividing the memory
space into four banks. The device allows a host sys-
t e m t o p r o g r a m o r e r a s e i n o n e b a n k , t h e n
immediately and simultaneously read from another
bank, with zero latency. This releases the system from
waiting for the c ompletion of program or er as e
operations.
The device is divided as shown in the following table:
The device uses Chip Enable (CE#), Write Enable
(WE#), Address Valid (AVD#) and Output Enable
(OE#) to control asynchronous read and write opera-
tions. For burst operations, the device additionally
requires Power Saving (PS), Ready (RDY), and Clock
(CLK). This implementation allows easy interface with
minimal glue logic to microprocessors/microcontrollers
for high performance read operations.
The device offers complete compatibility with the
JEDEC 42.4 single-power-supply Flash command
set standard
. Commands are written to the command
register using standard microprocessor write timings.
Reading data out of the device is similar to reading
from other Flash or EPROM devices.
The host system can detect whether a program or
erase operation is complete by using the device sta-
tus bit
DQ7 (Data# Polling) and DQ6/DQ2 (toggle
bits). After a program or erase cycle has been com-
pleted, the device automatically returns to reading
array data.
The sector erase architecture allows memory sec-
tors to be erased and reprogrammed without affecting
the data contents of other sectors. The device is fully
erased when shipped from the factory.
Hardware data protection measures include a low
V
CC
detector that automatically inhibits write opera-
tions during power transitions. The device also offers
three types of data protection at the sector level. The
sector lock/unlock command sequence disables or
re-enables both program and erase operations in any
sector. When at V
IL
, WP# locks the outermost sectors.
Finally, when V
PP
is at V
IL
, all sectors are locked.
The device offers two power-saving features. When
addresses have been stable for a specified amount of
time, the device enters the automatic sleep mode.
Th e s ys tem can al so plac e the de vi ce into the
standby mode. Power consumption is greatly re-
duced in both modes.
Bank A & B Sectors
Bank C & D Sectors
Quantity
Size
Quantity
Size
4
8 Kwords
32
32 Kwords
31
32 Kwords
32 Mbits total
32 Mbits total
November 9, 2001
Am29BDS643G
3
A D V A N C E I N F O R M A T I O N
TABLE OF CONTENTS
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 4
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Block Diagram of
Simultaneous Operation Circuit . . . . . . . . . . . . . . 5
Connection Diagram . . . . . . . . . . . . . . . . . . . . . . . . 6
Special Handling Instructions for FBGA Package .................... 6
Input/Output Descriptions . . . . . . . . . . . . . . . . . . . 7
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 8
Device Bus Operations . . . . . . . . . . . . . . . . . . . . . . 9
Table 1. Device Bus Operations .......................................................9
Requirements for Asynchronous Read Operation (Non-Burst) 9
Requirements for Synchronous (Burst) Read Operation .......... 9
Continuous Burst ...................................................................... 9
8-, 16-, and 32-Word Linear Burst with Wrap Around ............ 10
Table 2. Burst Address Groups .......................................................10
Programmable Wait State ...................................................... 10
Handshaking Feature ............................................................. 10
Power Saving Function ........................................................... 11
Simultaneous Read/Write Operations with Zero Latency ....... 11
Writing Commands/Command Sequences ............................ 11
Accelerated Program Operation ............................................. 11
Autoselect Functions .............................................................. 11
Automatic Sleep Mode ........................................................... 12
RESET#: Hardware Reset Input ............................................. 12
Output Disable Mode .............................................................. 12
Hardware Data Protection ...................................................... 12
Low VCC Write Inhibit ............................................................ 12
Write Pulse "Glitch" Protection ............................................... 12
Logical Inhibit .......................................................................... 12
Common Flash Memory Interface (CFI) . . . . . . . 13
Table 3. CFI Query Identification String ..........................................13
Table 4. System Interface String .....................................................14
Table 5. Device Geometry Definition ..............................................14
Table 6. Primary Vendor-Specific Extended Query ........................15
Table 7. Sector Address Table ........................................................16
Command Definitions . . . . . . . . . . . . . . . . . . . . . . 20
Reading Array Data ................................................................ 20
Set Configuration Register Command Sequence ................... 20
Table 8. Burst Modes ......................................................................20
Handshaking Feature ............................................................. 20
Table 9. Wait States for Handshaking .............................................21
Enable PS (Power Saving) Mode Command Sequence ........ 21
Sector Lock/Unlock Command Sequence .............................. 21
Reset Command ..................................................................... 21
Autoselect Command Sequence ............................................ 21
Program Command Sequence ............................................... 22
Unlock Bypass Command Sequence ..................................... 22
Figure 1. Program Operation .......................................................... 23
Chip Erase Command Sequence ........................................... 23
Sector Erase Command Sequence ........................................ 23
Erase Suspend/Erase Resume Commands ........................... 24
Figure 2. Erase Operation.............................................................. 24
Table 10. Command Definitions .................................................... 25
Write Operation Status . . . . . . . . . . . . . . . . . . . . 26
DQ7: Data# Polling ................................................................. 26
Figure 3. Data# Polling Algorithm .................................................. 26
DQ6: Toggle Bit I .................................................................... 27
Figure 4. Toggle Bit Algorithm........................................................ 27
DQ2: Toggle Bit II ................................................................... 28
Table 11. DQ6 and DQ2 Indications .............................................. 28
Reading Toggle Bits DQ6/DQ2 ............................................... 28
DQ5: Exceeded Timing Limits ................................................ 28
DQ3: Sector Erase Timer ....................................................... 29
Table 12. Write Operation Status ................................................... 29
Absolute Maximum Ratings . . . . . . . . . . . . . . . . 30
Figure 5. Maximum Negative Overshoot Waveform ...................... 30
Figure 6. Maximum Positive Overshoot Waveform ........................ 30
Operating Ranges . . . . . . . . . . . . . . . . . . . . . . . . . 30
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 31
Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Figure 7. Test Setup....................................................................... 32
Table 13. Test Specifications ......................................................... 32
Key to Switching Waveforms. . . . . . . . . . . . . . . . 32
Switching Waveforms. . . . . . . . . . . . . . . . . . . . . . 32
Figure 8. Input Waveforms and
Measurement Levels...................................................................... 32
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 33
Synchronous/Burst Read ........................................................ 33
Figure 9. Burst Mode Read (66 and 54 MHz) ................................ 33
Figure 10. Burst Mode Read (40 MHz) .......................................... 34
Asynchronous Read ............................................................... 35
Figure 11. Asynchronous Mode Read............................................ 35
Figure 12. Reset Timings ............................................................... 36
Erase/Program Operations ..................................................... 37
Figure 13. Program Operation Timings.......................................... 38
Figure 14. Chip/Sector Erase Operations ...................................... 39
Figure 15. Accelerated Unlock Bypass Programming Timing........ 40
Figure 16. Data# Polling Timings (During Embedded Algorithm) .. 41
Figure 17. Toggle Bit Timings (During Embedded Algorithm)........ 41
Figure 18. 8-, 16-, and 32-Word Linear Burst
Address Wrap Around.................................................................... 42
Figure 19. Latency with Boundary Crossing (54 MHz and 66 MHz) 42
Figure 20. Initial Access with Power Saving (PS)
Function and Address Boundary Latency ...................................... 43
Figure 21. Example of Extended Valid Address Reducing Wait State
Usage............................................................................................. 43
Figure 22. Back-to-Back Read/Write Cycle Timings ...................... 44
Erase and Programming Performance . . . . . . . 45
Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Physical Dimensions* . . . . . . . . . . . . . . . . . . . . . 46
VDA044--44-Ball Very Thin Fine-Pitch Ball Grid Array
(FBGA) 9.2 x 8.0 mm Package ............................................... 46
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 47
4
Am29BDS643G
November 9, 2001
A D V A N C E I N F O R M A T I O N
PRODUCT SELECTOR GUIDE
BLOCK DIAGRAM
Part
Number
Am29BDS643G
Synchronous/Burst
Asynchronous
Speed Option
7G
(40 MHz)
7M
(54 MHz)
5K
(66 MHz)
Speed Option
7G/7M
5K
V
CC
=
1.7 1.9 V
Max Initial Access Time, ns
(t
IACC
)
95
87.5
71
Max Access Time, ns (t
ACC
)
70
55
Max Burst Access Time, ns
(t
BACC
)
20
13.5
11
Max CE# Access, ns (t
CE
)
70
55
Max OE# Access, ns (t
OE
)
20
13.5
11
Max OE# Access, ns (t
OE
)
20
11
Input/Output
Buffers
X-Decoder
Y-Decoder
Chip Enable
Output Enable
Logic
Erase Voltage
Generator
PGM Voltage
Generator
Timer
V
CC
Detector
State
Control
Command
Register
V
CC
V
SS
WE#
RESET#
V
PP
CE#
OE#
A/DQ0
A/DQ15
Data
Latch
Y-Gating
Cell Matrix
A
ddr
es
s
Lat
c
h
A/DQ0A/DQ15
A16A21
RDY
Buffer
RDY
Burst
State
Control
Burst
Address
Counter
PS Buffer
PS
AVD#
CLK
A0A21
November 9, 2001
Am29BDS643G
5
A D V A N C E I N F O R M A T I O N
BLOCK DIAGRAM OF
SIMULTANEOUS OPERATION CIRCUIT
Note: A0A15 are multiplexed with DQ0DQ15.
V
CC
V
SS
Bank B Address
RESET#
WE#
CE#
AVD#
DQ0DQ15
STATE
CONTROL
&
COMMAND
REGISTER
Bank B
X-Decoder
Y-Decoder
Latches and
Control Logic
Bank A
X-Decoder
Y-Decoder
Latches and
Control Logic
DQ0DQ15
DQ0DQ15
DQ0DQ15
DQ0DQ15
DQ0
DQ15
Bank C
Y-Decoder
X-Decoder
Latches and
Control Logic
Bank D
Y-Decoder
X-Decoder
Latches and
Control Logic
OE#
OE#
OE#
OE#
Status
Control
A0A21
A0A21
A0A21
A0A21
A0A21
Bank C Address
Bank D Address
Bank A Address
PS
RDY